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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"SPC"

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"SPC"

Characteristics of poly-Si TFTs using Excimer Laser Annealing Crystallization and high-k Gate Dielectrics
J Electr Electron Mater 2008;21(1):1-4.   Published online January 1, 2008
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The Analysis of Degradation Characteristics in Poly-Silicon Thin Film Transistor Formed by Solid Phase Crystallization
Eun Sik Jung, Yong Jae Lee
J Electr Electron Mater 2003;16(1):26-32.   Published online January 1, 2003
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