Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

6
results for

"SPM"

Keywords

More +

Publication year

More +

Authors

"SPM"

Control of Contact Angle by Surface Treatment using Sanning Plasma Method
Young Gi Kim, Byoung Jung Choi, Sung Chae Yang
J Korean Inst Electr Electron Mater Eng 2010;23(1):10-13.   Published online January 1, 2010
DOI: https://doi.org/10.4313/JKEM.2010.23.1.010
  • 32 View
  • 0 Download
Large-area Uniform Deposition of Amorphous Hydrogenated Carbon Films using a Plasma CVD Method
Sang Min Yun, Sung Chae Yang
J Korean Inst Electr Electron Mater Eng 2009;22(5):411-414.   Published online May 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.5.411
  • 36 View
  • 0 Download
Plasma surface Treatment of the Polymeric Film with Low Temperature Process
Wook Cho, Sung Chae Yang
J Korean Inst Electr Electron Mater Eng 2008;21(5):486-491.   Published online May 1, 2008
DOI: https://doi.org/10.4313/JKEM.2008.21.5.486

Citations

Citations to this article as recorded by  
  • Improvement of Wettability and Removal of Skin Layer on Ar-Plasma-Treated Polypropylene Blend Surface
    Jong-Il Weon, Sun-Yong Lee
    Polymer Korea.2012; 36(4): 461.     CrossRef
  • 44 View
  • 0 Download
  • 1 Crossref
Partial Discharge Characteristics of the XLPE/EPDM Interface in Power Cable Joint
J Korean Inst Electr Electron Mater Eng 2007;20(9):780-786.   Published online September 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.9.780
  • 33 View
  • 0 Download
Fabrication and Characterization of 32×32 Silicon Cantilever Array using MEMS Process
J Korean Inst Electr Electron Mater Eng 2006;19(10):894-900.   Published online October 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.10.894
  • 33 View
  • 0 Download
Fabrication and Characterization of Thermal Probe Array on SOI Substrates
J Korean Inst Electr Electron Mater Eng 2005;18(11):990-995.   Published online November 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.11.990
  • 34 View
  • 0 Download
First First Prev Prev
Page of 1
Next Next Last Last