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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"SRAM"

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"SRAM"

Reliability on Accelerated Soft Error Rate in Static RAM of Thin Film Transistor Type
J Korean Inst Electr Electron Mater Eng 2006;19(6):507-511.   Published online June 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.6.507
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Wafer Burn-in Method for SRAM in Multi Chip Package
J Korean Inst Electr Electron Mater Eng 2005;18(6):506-509.   Published online June 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.6.506
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