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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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소프트 에러율에 대한 박막 트랜지스터형 정적 RAM의 신뢰성

김도우, 왕진석

Reliability on Accelerated Soft Error Rate in Static RAM of Thin Film Transistor Type

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J Electr Electron Mater 2006;19(6):507-511.
Published online: June 1, 2006
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Reliability on Accelerated Soft Error Rate in Static RAM of Thin Film Transistor Type
J Electr Electron Mater. 2006;19(6):507-511.   Published online June 1, 2006
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Reliability on Accelerated Soft Error Rate in Static RAM of Thin Film Transistor Type
J Electr Electron Mater. 2006;19(6):507-511.   Published online June 1, 2006
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