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Tunnel barrier engineering
WHERE t1.sid in(parameter_dbtbl_keyword '%Tunnel barrier engineering%') and t1.xml_status <> 99
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Annealing (1)
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Won Ju Cho (1)
Hong Bay Chung (1)
Myung Ho Jung (1)
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"Tunnel barrier engineering"
Improved Electrical Characteristics of Symmetrical Tunneling Dielectrics Stacked with SiO2 and Si3N4 Layers by Annealing Processes for Non-volatile Memory Applications
Min Soo Kim, Myung Ho Jung, Kwan Su Kim, Goon Ho Park, Jong Wan Jung, Hong Bay Chung, Young Hie Lee, Won Ju Cho
J Electr Electron Mater
2009;22(5):386-389.
Published online May 1, 2009
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