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사이리스터 소자의 수명예측을 위한 열화진단기술

김병철, 김형우, 서길수

The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices

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J Korean Inst Electr Electron Mater Eng 2007;20(3):197-201.
Published online: March 1, 2007
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The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices
J Korean Inst Electr Electron Mater Eng. 2007;20(3):197-201.   Published online March 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.3.197
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices
J Korean Inst Electr Electron Mater Eng. 2007;20(3):197-201.   Published online March 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.3.197
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