Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering

Hu Jie Jin, Soon Jin So, Choon Bae Park
J Korean Inst Electr Electron Mater Eng 2007;20(3):202-206.
Published online: March 1, 2007
  • 47 Views
  • 0 Download
  • 1 Crossref
  • 0 Scopus
prev next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering
J Korean Inst Electr Electron Mater Eng. 2007;20(3):202-206.   Published online March 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.3.202
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering
J Korean Inst Electr Electron Mater Eng. 2007;20(3):202-206.   Published online March 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.3.202
Close

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.