Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

낮은 저항온도계수를 갖는 박막 저항체 제작 및 신뢰성 특성 평가

이붕주

Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance

J Electr Electron Mater 2007;20(4):352-356.
Published online: April 1, 2007
  • 6 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance
J Electr Electron Mater. 2007;20(4):352-356.   Published online April 1, 2007
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance
J Electr Electron Mater. 2007;20(4):352-356.   Published online April 1, 2007
Close