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낮은 저항온도계수를 갖는 박막 저항체 제작 및 신뢰성 특성 평가

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Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance

J Korean Inst Electr Electron Mater Eng 2007;20(4):352-356.
Published online: April 1, 2007
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Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance
J Korean Inst Electr Electron Mater Eng. 2007;20(4):352-356.   Published online April 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.4.352
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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Fabrication and Reliability Properties of Thin Film Resistors with Low Temperature Coefficient of Resistance
J Korean Inst Electr Electron Mater Eng. 2007;20(4):352-356.   Published online April 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.4.352
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