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PMOSFET에서 채널 방향에 대한 소자 성능 의존성

복정득, 박예지, 한인식, 권혁민, 박병석, 박상욱, 임민규, 정의선, 이정환, 이희덕

Dependence of Device Performance and Reliability on Chanel Direction in PMOSFET`s

Jung Deuk Bok, Ye Ji Park, In Shik Han, Hyuk Min Kwon, Byoung Seok Park, Sang Uk Park, Min Gyu Lim, Yi Sun Chung, Jung Hwan Lee, Hi Deok Lee
J Electr Electron Mater 2010;23(6):431-435.
Published online: June 1, 2010
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Dependence of Device Performance and Reliability on Chanel Direction in PMOSFET`s
J Electr Electron Mater. 2010;23(6):431-435.   Published online June 1, 2010
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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Dependence of Device Performance and Reliability on Chanel Direction in PMOSFET`s
J Electr Electron Mater. 2010;23(6):431-435.   Published online June 1, 2010
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