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저온에서 증착한 CdSe막의 구조적 및 전기적 특성

박기철, 마대영

The Structural and Electrical Properties of CdSe Films Deposited at Low Temperature

Ki Cheol Park, Tae Young Ma
J Electr Electron Mater 2010;23(10):776-781.
Published online: October 1, 2010
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CdSe films were deposited on glass substrates (CdSe/glass) by thermal evaporation. Substrate temperature was lowered by cooling substrate holder with liquid nitrogen. Substrate temperatures were 200℃, 0℃ and -40℃. The crystallographic properties and surface morphologies of the CdSe/glass films were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The optical and electrical properties of the films were investigated by dependence of energy gap, photosensitivity and resistivity on the substrate temperature. CdSe/glass showed energy gap of ~1.72 eV regardless of substrate temperature. The resistivity of the films decreased to 0.5 Ωcm by lowering the substrate temperature to -40℃. The CdSe/glass films prepared at 0℃ showed the highest photosensitivity among the films in this study.

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The Structural and Electrical Properties of CdSe Films Deposited at Low Temperature
J Electr Electron Mater. 2010;23(10):776-781.   Published online October 1, 2010
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Structural and Electrical Properties of CdSe Films Deposited at Low Temperature
J Electr Electron Mater. 2010;23(10):776-781.   Published online October 1, 2010
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