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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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전자 수송층을 삽입한 용액 공정형 산화물 트랜지스터의 특성 평가

김한상, 김성진

Characterization of Solution-Processed Oxide Transistor with Embedded Electron Transport Buffer Layer

Han-sang Kim, Sung-jin Kim
J Electr Electron Mater 2017;30(8):491-495.
Published online: August 1, 2017
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We investigated solution-processed indium-zinc oxide (IZO) thin-film transistors (TFTs) by inserting a 2-(4- biphenylyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole (PBD) buffer layer. This buffer layer efficiently tuned the energy level between the semiconducting oxide channel and metal electrode by increasing charge extraction, thereby enhancing the overall device performance: the IZO TFT with embedded PBD layer (thickness: 5 nm; width: 2,000 μm; length: 200 μm) exhibited a field-effect mobility of 1.31 cm2V-1s-1, threshold voltage of 0.12 V, subthreshold swing of 0.87 V decade-1, and on/off current ratio of 9.28×105.

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Characterization of Solution-Processed Oxide Transistor with Embedded Electron Transport Buffer Layer
J Electr Electron Mater. 2017;30(8):491-495.   Published online August 1, 2017
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Characterization of Solution-Processed Oxide Transistor with Embedded Electron Transport Buffer Layer
J Electr Electron Mater. 2017;30(8):491-495.   Published online August 1, 2017
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