Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

  • HOME
  • BROWSE ARTICLES
  • Previous issues
16
results for

Previous issues

Keywords

Previous issues

Prev issue Next issue

Volume 18(1); January 2005

Modeling of Plasma Etch Process using a Radial Basis Function Network
J Korean Inst Electr Electron Mater Eng 2005;18(1):1-5.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.001
  • 29 View
  • 0 Download
A Study on the Electrical Characteristics in the Static Induction Transistor with Trench Oxide
J Korean Inst Electr Electron Mater Eng 2005;18(1):6-11.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.006
  • 38 View
  • 0 Download
Planarization Characteristics of CMP for WO3 Film with an Addition of Oxidizers
J Korean Inst Electr Electron Mater Eng 2005;18(1):12-16.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.012
  • 37 View
  • 0 Download
  • 31 View
  • 0 Download
A Study on DOE Method to Optimize the Process Parameters for Cu CMP
J Korean Inst Electr Electron Mater Eng 2005;18(1):24-29.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.024
  • 37 View
  • 0 Download
Microwave Dielectric Characteristics of Ba(Mg1/3Nb2/3)O3-La(Mg2/3Nb1/3)O3 Ceramics with Crystal Structure
J Korean Inst Electr Electron Mater Eng 2005;18(1):30-37.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.030
  • 22 View
  • 0 Download

Citations

Citations to this article as recorded by  
  • Microwave Dielectric Properties of the LiNb3O8-TiO2 Ceramic System with the Addition of Low Firing Agents
    Myung Ho Choi, Nam Chul Kim
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2008; 21(6): 517.     CrossRef
  • 35 View
  • 0 Download
  • 1 Crossref
Improving Thermal Resisting Property of PZT Ceramics by Thermal Aging
J Korean Inst Electr Electron Mater Eng 2005;18(1):43-49.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.043
  • 29 View
  • 0 Download
  • 33 View
  • 0 Download
Microwave Dielectric Properties of 0.6TiTe3O8-0.4MgTiO3 Ceramics with Addition of H3BO3-SnO
J Korean Inst Electr Electron Mater Eng 2005;18(1):57-61.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.057
  • 47 View
  • 0 Download
Tracking Performance Test of Polymer Insulator with Salt Solution which is added Surface Active Agent
J Korean Inst Electr Electron Mater Eng 2005;18(1):62-67.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.062
  • 35 View
  • 0 Download
Optimization Study on Polymerization of Crosslink-type Gel Polymer Electrolyte for Lithium-ion Polymer Battery
J Korean Inst Electr Electron Mater Eng 2005;18(1):68-74.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.068
  • 32 View
  • 0 Download
The Resistivity Properties and Adhesive Strength of Cu Thin Firms Fabricated by EBE Method
J Korean Inst Electr Electron Mater Eng 2005;18(1):75-80.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.075
  • 32 View
  • 0 Download
The Surface Morphology of Polymer Langmuir Film
J Korean Inst Electr Electron Mater Eng 2005;18(1):81-88.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.081
  • 35 View
  • 0 Download
  • 27 View
  • 0 Download
A Study on the Electric Performance of Porcelain Insulator with Al2O3 Addition in Transmission Line
J Korean Inst Electr Electron Mater Eng 2005;18(1):96-103.   Published online January 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.1.096

Citations

Citations to this article as recorded by  
  • Deterioration of Porcelain Insulators Utilized in Overhead Transmission Lines: A Review
    Simpy Sanyal, Fawad Aslam, Taeyong Kim, Seongho Jeon, Youn-Jung Lee, Junsin Yi, In-Hyuk Choi, Ju-Am Son, Ja-Bin Koo
    Transactions on Electrical and Electronic Materials.2020; 21(1): 16.     CrossRef
  • 32 View
  • 0 Download
  • 1 Crossref