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Keywords
Dielectric properties (2)
Partial discharge (2)
Ag-Sn-In (1)
AIN (1)
Al2O3 (1)
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Authors
Arsen Babajayan (1)
Keywords
Dielectric properties (2)
Partial discharge (2)
Ag-Sn-In (1)
AIN (1)
Al2O3 (1)
Ammonium sulfide solution (1)
Animal cell (1)
Benzotriazole (1)
Borosilicate (1)
BTA (1)
C-V (1)
Capacitance-voltage (1)
Ceramic/glass (1)
Citric acid (1)
Classification (1)
Colloidal silica (1)
Contact material (1)
Copper CMP (1)
CS sol (1)
Diagnosis (1)
Dielectric constant (1)
Electrical tree (1)
Electromechanical coupling factor (1)
Finite difference method (1)
Flicker noise (1/f noise) (1)
Hybrid film (1)
Hydrogen peroxide (1)
Initial-oxidation (1)
Internal oxidation (1)
Kelvin-probe method (1)
Lead-free ceramics (1)
Low-frequency noise (1)
Low-Level Light source (1)
LTCC (1)
Mechanical quality factor (1)
Mobility (1)
MSD (1)
MTT assay (1)
Multilayer ultrasonic nozzle (1)
Nano CMOSFET (1)
Nano silica (1)
Natronomonas pharaonis (1)
Near-field microwave microscope (1)
Near-field scanning microwave microscope (1)
NpSR 2 (1)
NSMM (1)
OLED (1)
Optical power (1)
Organic field-effect transistor (OFET) CuPc (1)
Organic pentacene (1)
PEI (1)
Piezoelectric constant (1)
Piezoelectric planer coupling factor (1)
poly(epoxy-imide) (1)
Power cable (1)
Probability density (1)
Rapid solidification process (1)
Reactive sputtering method (1)
Reflection coefficient (1)
Reflection coefficient S(11) (1)
Remote plasma nitride oxide (1)
Rubrene (1)
S(11) (1)
Sensory rhodopsin 2 (1)
Sintering aids (1)
Stator winding (1)
Sub-threshold swing (1)
Surface potential (1)
Te (1)
Two colors (1)
Uniformity (1)
Very thin emission Layer (1)
Wavelet transform (1)
Wavelet-neural network (1)
White Light emission (1)
δ-doping (1)
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Previous issues
Volume 20(1); January 2007
Dependence of Low-frequency Noise and Device Characteristics on Initial Oxidation Method of Plasma-nitride Oxide for Nano-scale CMOSFET
J Korean Inst Electr Electron Mater Eng
2007;20(1):1-7.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.001
PDF
37
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0
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Electrical Characteristic of Al/AIN/GaAs MIS Capacitor Fabricated by Reactive Sputtering Method for the (NH4)2S Treatment
J Korean Inst Electr Electron Mater Eng
2007;20(1):8-13.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.008
PDF
36
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0
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Electron Distribution in the GaAs - Al(x)Ga(1-x)As Quantum Well with the Si δ-doped Layer in a Non-central Position under the External Electric Field
J Korean Inst Electr Electron Mater Eng
2007;20(1):14-18.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.014
PDF
33
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0
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The Properties on Ceramic/glass Composites of SiO2-B2O3-R(R=CaO, BaO, ZnO, Bi2O3) Borosilicate Glass System for Low Temperature Ceramics
J Korean Inst Electr Electron Mater Eng
2007;20(1):19-24.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.019
PDF
Citations
Citations to this article as recorded by
Recent Advancements in Glass Matrix Composites: A Comprehensive Review of Fabrication, Properties, and Applications
Vivek Kumar Saroj, Nikhil Raj Devgan, Mukta Rajotia, Subrata Panda
Journal of the American Ceramic Society.2026;[Epub]
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1
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Piezoelectric and Dielectric Characteristics of Lead Free [Li(0.04)(Na(y)K(1-y)(0.96)](Nb(0.86)Ta(0.1)Sb(0.04))O3 Ceramics with the Variations of Na/K Ratio
J Korean Inst Electr Electron Mater Eng
2007;20(1):25-30.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.025
PDF
38
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0
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Piezoelectric and Dielectric Characteristics of Low Temperature Sintering PMN-PNN-PZT Ceramics According to the amount of PbO
J Korean Inst Electr Electron Mater Eng
2007;20(1):31-34.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.031
PDF
31
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0
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Synthesis of Poly(epoxy-imide)-Nano Silica Hybrid Film via CS Sol-gel Process and Their Dielectric Properties
J Korean Inst Electr Electron Mater Eng
2007;20(1):35-40.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.035
PDF
31
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0
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A Study on Space Charge of Organic Pentacene/metal Interface
Arsen Babajayan
J Korean Inst Electr Electron Mater Eng
2007;20(1):41-46.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.041
PDF
39
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1
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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor
J Korean Inst Electr Electron Mater Eng
2007;20(1):47-52.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.047
PDF
38
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0
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Electrical and Optical Characteristics of White OLEDs with a Rubrene doped Layer
J Korean Inst Electr Electron Mater Eng
2007;20(1):53-56.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.053
PDF
36
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0
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Analysis of PD Distribution Characteristics and Comparison of Classification Methods according to Electrical Tree Source in Power Cable
J Korean Inst Electr Electron Mater Eng
2007;20(1):57-64.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.057
PDF
36
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0
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Classification of Insulation Fault Signals for High Voltage Motors Stator Winding using Image Signal Process Technique
J Korean Inst Electr Electron Mater Eng
2007;20(1):65-73.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.065
PDF
37
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0
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Mechanical Analysis on Uniformity in Copper Chemical Mechanical Planarization
J Korean Inst Electr Electron Mater Eng
2007;20(1):74-79.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.074
PDF
43
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0
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Optical Characterization of Sensory Rhodopsin 2 Thin Films using a Near-filed Scanning Microwave Microscope
J Korean Inst Electr Electron Mater Eng
2007;20(1):80-85.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.080
PDF
32
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0
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The Effect of the Te on the Microstructure of Rapidly Solidification Ag-Sn-In Contact Material
J Korean Inst Electr Electron Mater Eng
2007;20(1):86-91.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.086
PDF
36
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0
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Characteristics of Low-Level Light Source for Animal Cell Proliferation
J Korean Inst Electr Electron Mater Eng
2007;20(1):92-97.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.092
PDF
34
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0
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