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CuPc (2)
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Addressing delay time (1)
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Ju Hyun Yoo (2)
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Hui Chul An (1)
Dong Jin Byun (1)
Min Woo Cheon (1)
Eou Sik Cho (1)
Hong Goo Choi (1)
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Previous issues
Volume 21(10); October 2008
TLP Properties Evaluation of ESD Protection Device of GGNMOS Type for Conventional CMOS Process
Tae Il Lee, Hong Bae Kim
J Electr Electron Mater
2008;21(10):875-880.
Published online October 1, 2008
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Effect of Thickness on Electrical Properties of PVDF-TrFE(51/49) Copolymer
Joo Nam Kim, Ho Seung Jeon, Hui Seong Han, Jong Hyung Im, Byung Eun Park, Chul Ju Kim
J Electr Electron Mater
2008;21(10):881-884.
Published online October 1, 2008
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0
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Simulated DC Charceristics of AlGaN HEMTs with Trench Shapped Source, Dracin Strucures
Kang Min Jung, Young Soo Lee, Su Jin Kim, Dong Ho Kim, Jae Moo Kim, Hong Goo Choi, Cheol Koo Hahn, Tae Geun Kim
J Electr Electron Mater
2008;21(10):885-888.
Published online October 1, 2008
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4
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A Study on the 1,700 V Rated NPT Trench 1GBT Analysis by PIN Diode-PNP Transistor Model
Jong Seok Lee, Sin Su Kyoung, Ey Goo Kang, Man Young Sung
J Electr Electron Mater
2008;21(10):889-895.
Published online October 1, 2008
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A Dielectric Constant Measurement Method of Unprepared Samples
Won Hui Lee
J Electr Electron Mater
2008;21(10):896-900.
Published online October 1, 2008
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Dielectric and Piezoelectric Characteristics of (Na,K)NbO3 Ceramics System According to Sintering Time
Do Hyung Kim, Ju Hyun Yoo, In Sung Kim, Sae Sung Song
J Electr Electron Mater
2008;21(10):901-905.
Published online October 1, 2008
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4
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Piezoelectric and Dielectric Properties of Low Temperature Sintering (K0.5Na0.5)NbO3 Ceramics according to Sintering Aid Li2CO3
IL Ha Lee, Ju Hyun Yoo
J Electr Electron Mater
2008;21(10):906-910.
Published online October 1, 2008
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3
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The Fabrication and Characteristics of White Emission Using CCM on Flexible Substrate
Gi Ryoung Kim, Sung Il Ahn, Jeong Hun Kum, Heung Ryeol Lee, Tae Hong Yim, Seong Eui Lee
J Electr Electron Mater
2008;21(10):911-915.
Published online October 1, 2008
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A Study on Discharge Characteristics of the PDP Packaged with In-situ Vacuum Sealing with the MgO Protective Layer Deposited by Optimal Evaporation Rate
Zhao Hui Li, Eou Sik Cho, Sang Jik Kwon
J Electr Electron Mater
2008;21(10):916-922.
Published online October 1, 2008
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Physical Properties of ITO/PVDF as a Function of Oxygen Partial Pressure
Sang Yub Lee, Ji Hwan Kim, Dong Hee Park, Dong Jin Byun, Won Kook Choi
J Electr Electron Mater
2008;21(10):923-929.
Published online October 1, 2008
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4
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Electrical Properties of CuPc Field-effect Transistor with Different Electrodes
Ho Shik Lee, Yong Pil Park, Min Woo Cheon
J Electr Electron Mater
2008;21(10):930-933.
Published online October 1, 2008
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Surface Potential Properties of CuPc/Au Interface with Varying Temperature
Ho Shik Lee, Yong Pil Park
J Electr Electron Mater
2008;21(10):934-937.
Published online October 1, 2008
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3
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Electrical and Optical Properties of Semitransparent Metal Electrodes for Top-emission Organic Light-emitting Diodes
Eun Chul Shin, Hui Chul An, Tae Wan Kim
J Electr Electron Mater
2008;21(10):938-942.
Published online October 1, 2008
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Fabrication of Superconducting Transition Edge Sensors based on Ti/Au Bilayer Formation
Young Hwa Lee, Yong Hamb Kim
J Electr Electron Mater
2008;21(10):943-949.
Published online October 1, 2008
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Effect of Transport Current Properties on Connecting of YBCO Coated Conductor having Stabilizer Layer and BSCCO Tape
Ho Ik Du, Min Ju Kim, Chung Ryul Park, Seung Gyu Doo, Yong Jin Kim, Byoung Sung Han
J Electr Electron Mater
2008;21(10):950-953.
Published online October 1, 2008
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5
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The Effects of Elastic Modulus Coefficient and Linear Expansion Coefficient of Overhead Conductor on Sag Bahavior
Byung Geol Kim, Shang Shu Kim, Yun Chan Wang
J Electr Electron Mater
2008;21(10):954-960.
Published online October 1, 2008
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