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Volume 19(2); February 2006

Effects of Heat Treatment on the Properties of ITO Films Deposited with Powder Target: J Korean Inst Electr Electron Mater Eng 2006;19(2):109-115. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.109

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An Atomistic Modeling for Electromechanical Nanotube Memory Study: J Korean Inst Electr Electron Mater Eng 2006;19(2):116-125. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.116

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Optimization of Capacitor Threshold V(T) Implantation for Planar P-MOS DRAM Cell: J Korean Inst Electr Electron Mater Eng 2006;19(2):126-129. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.126

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Improved Defect Control Problem using Scaled Down Silicon Oxide Stamps for Nanoimprint Lithography: J Korean Inst Electr Electron Mater Eng 2006;19(2):130-138. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.130

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A Study on Optimization of Manufacturing Condition for LiNi(1/3)Mn(1/3)Co(1/3)O2-based Cathode Electrode: J Korean Inst Electr Electron Mater Eng 2006;19(2):139-144. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.139

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Effects of Strontium Gallate Additions on Sintering Behavior and Electrical Conductivity of Ce(0.8)Gd(0.2)O(2-δ) Ceramics: J Korean Inst Electr Electron Mater Eng 2006;19(2):145-152. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.145

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Adhesion Characteristics of Semiconductive and Insulating Silicone Rubber by Oxygen Plasma Treatment: J Korean Inst Electr Electron Mater Eng 2006;19(2):153-157. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.153

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A Studying on the Crosstalk Characteristic of mm-wave Coplanar-waveguide: J Korean Inst Electr Electron Mater Eng 2006;19(2):158-161. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.158

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Classification Technique of Kaolin Contaminants Degree for Polymer Insulator using Electromagnetic Wave: J Korean Inst Electr Electron Mater Eng 2006;19(2):162-168. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.162

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Citations

Citations to this article as recorded by

Harmonics Analysis of Leakage Current due to Artificial Contamination of Distribution Arresters
Jae-Jun Park
The Transactions of The Korean Institute of Electrical Engineers.2012; 61(9): 1306. CrossRef
Analysis of Leakage Current Waveforms for Transmission Line Porcelain Insulators due to ESDD Contamination
Jae-Jun Park
The Transactions of The Korean Institute of Electrical Engineers.2012; 61(10): 1461. CrossRef

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Variation in Leakage Current Characteristics of Polymer Insulator for Various Environmental Condition: J Korean Inst Electr Electron Mater Eng 2006;19(2):169-175. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.169

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Citations

Citations to this article as recorded by

Analysis of Leakage Current Waveforms for Transmission Line Porcelain Insulators due to ESDD Contamination
Jae-Jun Park
The Transactions of The Korean Institute of Electrical Engineers.2012; 61(10): 1461. CrossRef
Harmonics Analysis of Leakage Current due to Artificial Contamination of Distribution Arresters
Jae-Jun Park
The Transactions of The Korean Institute of Electrical Engineers.2012; 61(9): 1306. CrossRef

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2 Crossref

Growth of Highly (100) Oriented (Na(0.5)Bi(0.5))TiO3 Thin Films on LaNiO3 Electrode: J Korean Inst Electr Electron Mater Eng 2006;19(2):176-180. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.176

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Surface Modification of Polydimethylsiloxane using Nd:YAG Laser: J Korean Inst Electr Electron Mater Eng 2006;19(2):181-184. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.181

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Study on the Reverse Twist According to the Rubbing Direction for the Fringe-Field Switching (FFS) Mode: J Korean Inst Electr Electron Mater Eng 2006;19(2):185-188. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.185

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A Study on Improved Pore Uniformity of Nano Template using the Rapid Thermal Anneal: J Korean Inst Electr Electron Mater Eng 2006;19(2):189-194. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.189

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Study for the Real Optical Path in the TFT-LCD 3-dimensional Simulation: J Korean Inst Electr Electron Mater Eng 2006;19(2):195-199. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.195

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Electrical and Optical Characteristics by Ferrite for Electrodeless Fluorescent Lamp: J Korean Inst Electr Electron Mater Eng 2006;19(2):200-206. Published online February 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.2.200

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