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Volume 16(3); March 2003

Stabilization of Modified Deceleration Mode for Improvement of Low-energy Ion implantation Process: Yong Jin Seo, Chang Jun Park, Sang Yong Kim; J Korean Inst Electr Electron Mater Eng 2003;16(3):175-180. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.175

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Impact of Post Gate Oxidation Anneal on Negatlve Bias Temperature Instability of Deep Submicron PMOSFETs: Young Min Kim; J Korean Inst Electr Electron Mater Eng 2003;16(3):181-185. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.181

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Electrical Characteristics of PZT Thin Film - Deposited by Rf-magnetron Sputtering as Pb Excess Content of Target: Kyu Il Lee, Hyun Il Kang, Young Park, Ki Yub Park, Joon Tae Song; J Korean Inst Electr Electron Mater Eng 2003;16(3):186-189. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.186

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Hydrogen Post-annealing Effect of (Pb0.72 La0.28)Ti0.93O3 Films Fabricated by Pulsed Laser Deposition: Kyoung Bo Han, Chang Hoon Jeon, Hee Sauk Jhon, Sang Yeol Lee; J Korean Inst Electr Electron Mater Eng 2003;16(3):190-194. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.190

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A Study on the Properties and Fabrication fo the ( Ba, Bi, Sr ) TiO3 Ceramics for the Application of High Capacitance: Sang Chul Lee, Eui Sun Choi, Seon Gi Bae, Young Hie Lee; J Korean Inst Electr Electron Mater Eng 2003;16(3):195-201. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.195

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Effects of Glass Frit Addition on Microstructures and Dielectric Properties of Sintered BaTiO3 Ceramics
Duck Hyun Woo, Man Soon Yoon, Yong Ho Son, Sung Lim Ryu, Soon Chul Ur, Soon Yong Kweon
Journal of Korean Institute of Electrical and Electronic Materials Engineers.2010; 23(3): 206. CrossRef

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Resonant Characteristics of SMD Type - Modified PbTiO3 Ceramic Resonator with the Variations of Electrode Weight: Dong On Oh, Ju Hyun Yoo, Chang Yub Park, Sung Lim Ryu, Jong Sun Kim, Yeong Ho Jeong; J Korean Inst Electr Electron Mater Eng 2003;16(3):202-206. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.202

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Electrical Properties of SBT Capacitors with various Annealing Atmosphere: Choon Nam Cho, Jin Sa Kim, Cheol Gi Shin, Woon Shik Choi, Chung Hyeok Kim, Jin Woong Hong, Joon Ung Lee; J Korean Inst Electr Electron Mater Eng 2003;16(3):207-213. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.207

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Display : A Study on Liquid Crystal Alignment Effects by UV Alignment Method on a Diamond-Like-Carbon Thin Film Surface: Jeoung Yeon Hwang, Yong Min Jo, Dae Shik Seo; J Korean Inst Electr Electron Mater Eng 2003;16(3):214-218. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.214

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Display : Wide-Viewing Angle Characteristics of MVA Cell using Photolithograph with Homeotropic Photopolymer Surface: Jeoung Yeon Hwang, Kyung Jun Lee, Jae Ho Lee, Tae Ho Kim, Sang Keuk Lee, Dae Shik Seo; J Korean Inst Electr Electron Mater Eng 2003;16(3):219-223. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.219

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Display : Dynamic Stability Depending on the Dielectric Anisotropy of the LC in the Fringe-Field Switching (FFS) mode: M. S. Kim, H. Y. Kim, S. H. Lee; J Korean Inst Electr Electron Mater Eng 2003;16(3):224-230. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.224

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Melt textured Growth and Superconducting Properties of RE3+ Elements Doped YBCO Superconductors: So Jung Kim; J Korean Inst Electr Electron Mater Eng 2003;16(3):231-237. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.231

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Simulations of Ferromagnetic Resonance Spectra Excited in Magnetic Bilayers: Yark Yeon Kim, Gee Pyeong Han, Seong Cho Yu; J Korean Inst Electr Electron Mater Eng 2003;16(3):238-246. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.238

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High Voltage Engineering : Effect of Dielectrics on Nox Removal of Metal Particle-Al2O3 Barrier-Reactor: J. Y. Park, J. S. Kim, H. S. Goh, H. M. Kim, M. H. Bee; J Korean Inst Electr Electron Mater Eng 2003;16(3):247-252. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.247

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Other : Interference Cancellation System to Prevent the Oscillation of the Wireless Communication System using the Same Frequency: S. J. Kim, N. Y. Kim; J Korean Inst Electr Electron Mater Eng 2003;16(3):253-262. Published online March 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.3.253

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