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Volume 18(3); March 2005

Investigation for Multi-bit per Cell on the CSL-NOR Type SONOS Flash Memories: J Electr Electron Mater 2005;18(3):193-198. Published online March 1, 2005

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Characterization of CdS Thin Films and CdS/CdTe Heterojunction Prepared by Different Techniques: J Electr Electron Mater 2005;18(3):199-205. Published online March 1, 2005

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A Study for Stable End Point Detection in 90 nm WSix/poly-Si Stack-down Gate Etching Process: J Electr Electron Mater 2005;18(3):206-211. Published online March 1, 2005

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Modified Illumination with a Concentric Circular Grating at the Backside of a Photomask: J Electr Electron Mater 2005;18(3):212-215. Published online March 1, 2005

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Optimal Design of Spiral Inductors on Silicon Substrates for RF ICs: J Electr Electron Mater 2005;18(3):216-218. Published online March 1, 2005

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Polishing Properties by Change of Slurry Temperature in Oxide CMP: J Electr Electron Mater 2005;18(3):219-225. Published online March 1, 2005

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A Study on Photocatalytic Degradation Properties by Oxygen Partial Pressure for TiO2 Thin Films Fabricated by DC Magnetron Sputtering: J Electr Electron Mater 2005;18(3):226-230. Published online March 1, 2005

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The Fabrication of Micro-electrodes to Analyze the Single-grainboundary of ZnO Varistors and the Analysis of Electrical Properties: J Electr Electron Mater 2005;18(3):231-236. Published online March 1, 2005

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Microstructural and Piezoelectric Properties of Low Temperature Sintering PMN-PZT Ceramics with the Variations of Sintering Times: J Electr Electron Mater 2005;18(3):237-242. Published online March 1, 2005

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Piezoelectric and Dielectric Characteristics of Low Temperature Sintering PNW-PMN-PZT Ceramics according to CaCO3 Addition: J Electr Electron Mater 2005;18(3):243-247. Published online March 1, 2005

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Electric Field Strength and Compressive Stress Effects on the Displacement of Multilayered Ceramic Actuators: J Electr Electron Mater 2005;18(3):248-252. Published online March 1, 2005

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Characteristics of CrOx Thin-films for High Precision Resistors: J Electr Electron Mater 2005;18(3):253-258. Published online March 1, 2005

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Work Function Changes on MgO Protective Layer after O2-plasma Treatment from Ion-induced Secondary Electron Emission Coefficient: J Electr Electron Mater 2005;18(3):259-263. Published online March 1, 2005

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2.2-inch QCIF+ a-Si TFT- LCD using Integrated Row Driver Circuits: J Electr Electron Mater 2005;18(3):264-268. Published online March 1, 2005

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Variance of Initial Fault Current Limiting Instant in Flux-Lock Type SFCL: J Electr Electron Mater 2005;18(3):269-275. Published online March 1, 2005

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Fabrication and Characteristics of Magnetic Tunneling Transistors using the Amorphous n-Type Si Films: J Electr Electron Mater 2005;18(3):276-283. Published online March 1, 2005

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