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Volume 16(5); May 2003

Characterization of the Annealing Effect of 0.5 % Ce-doped Ba(Zr0.2Ti0.8)O3 Thin Films Grown by RF Magnetron Sputtering Method: Won Seok Choi, Yang Seob Perk, Jun Sin Yi, Byung You Hong; J Korean Inst Electr Electron Mater Eng 2003;16(5):361-364. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.361

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Bonding Property of Silicon Wafer Pairs with Annealing Method: Hong Seok Min, Sang Hyun Lee, Oh Sung Song, Young Chang Joo; J Korean Inst Electr Electron Mater Eng 2003;16(5):365-371. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.365

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A Study on the High Integrated 1TC SONOS Flash Memory: Joo Yeon Kim, Byeong Chel Kim, Kwang Yell Seo; J Korean Inst Electr Electron Mater Eng 2003;16(5):372-377. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.372

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Surface Reactions on the Bi4-xLaxTi3O12 Thin Films Etched in Inductively Coupled CF4/Ar Plasma: Dong Pyo Kim, Kyoung Tae Kim, Chang II Kim; J Korean Inst Electr Electron Mater Eng 2003;16(5):378-384. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.378

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Application of Herd Porous Pad in Metal CMP Process: Sang Yong Kim, Nam Hoon Kim, In Pyo Kim, Eui Goo Chang; J Korean Inst Electr Electron Mater Eng 2003;16(5):385-389. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.385

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Effects of Cobalt Ohmic Layer on Contact Resistance: Cheong Hwee Cheong, Oh Sung Song; J Korean Inst Electr Electron Mater Eng 2003;16(5):390-396. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.390

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Microwave Dielectric Properties of (1-x)ZnWO4-xTiO2 Ceramics: Sang Ok Yoon, Dai Min Kim, Sang Heung Shim, Ki Sung Kang; J Korean Inst Electr Electron Mater Eng 2003;16(5):397-403. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.397

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Characterization of Embedded Inductors using Partial Element Equivalent Circuit Models: Dong Wook Shin, Chang Hoon Oh, Kyu Bok Lee, Jong Kyu Kim, Il Gu Yun; J Korean Inst Electr Electron Mater Eng 2003;16(5):404-408. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.404

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Display : Electrical Properties and Luminous Efficiency in Organic Light-Emitting Diodes Depending on Buffer Layer and Cathodes: Dong Hoe Chung, Sang Keol Kim, Jin Woong Hong, Joon Ung Lee, Tae Wan Kim; J Korean Inst Electr Electron Mater Eng 2003;16(5):409-417. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.409

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Citations

Citations to this article as recorded by

Effects of Emission Layer Thickness on the Efficiency of Blue Phosphorescent Organic Light Emitting Diodes with Triple Layer Structure
Yu Seok Seo, Dae Gyu Moon
Journal of Korean Institute of Electrical and Electronic Materials Engineers.2010; 23(2): 143. CrossRef

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Optical Devices Influence of Current Distributions on Critical Current and AC Loss Characteristics in a 3-conductor: Kyung Woo Ryu, Byoung Ju Choi; J Korean Inst Electr Electron Mater Eng 2003;16(5):418-423. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.418

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Optical Devices Superconducting Flux Flow Transistor using Plasma Etching: Hyeong Gon Kang, Seok Cheol Ko, Myoung Ho Choi, Yoon Bong Hahn, Byoung Sung Man; J Korean Inst Electr Electron Mater Eng 2003;16(5):424-428. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.424

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Optical Devices Magnetic Field Sensor using BiPbSrcaCuO Superconductor: Sang Heon Lee, Sung Gup Lee, Young Hie Lee; J Korean Inst Electr Electron Mater Eng 2003;16(5):429-434. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.429

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High Voltage Engineering : Determination of the Electron Collision Cross Sections by Electron Swarm Method: Byung Hoon Jeon, Sung Chul Ha; J Korean Inst Electr Electron Mater Eng 2003;16(5):435-440. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.435

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Other : Microstructure and Electrical Properties of SnO2 Thin Films Grown by Thermal CVD Method: Jin Jeong, Seong Pyung Choi, Dong Chan Shin, Jae Bon Koo, Ho Jun Song, Jin Seoung Park; J Korean Inst Electr Electron Mater Eng 2003;16(5):441-447. Published online May 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.5.441

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