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Volume 25(5); May 2012

Regular Paper : Semiconductor ; The Phase-change Memory Characteristics of Ge1Se1Te2 Thin Films for Sb Photo Doping
Ki Hyun Nam, Jang Han Kim, Hong Bay Chung
J Electr Electron Mater 2012;25(5):329-333.   Published online May 1, 2012
For phase transition method, good record sensitivity, low heat radiation, fast crystallization and hi-resolution are essential. Also, a retention time is very important part for phase-transition. In our past papers, we chose composition of Ge1Se1Te2 material to use a Se factor which has good optical sensitivity than conventional Sb. Sb/Ge-Se-Te thin films are fabricated and irradiated with UV light source to investigate a reversible phase change by Sb-doped condition. Because of Sb atoms, the Sb inserted sample showed better performance than conventional one. We should note that this novel one showed another possibility for phase-change random access memory.
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Regular Paper : Semiconductor ; A Study on Standby Power and Reduced Power Consumption Control System for High-efficiency Module
Myung Hwan Lee, Yung Teak Park, Hun Suk Chung, Ey Goo Kang
J Electr Electron Mater 2012;25(5):334-339.   Published online May 1, 2012
A study on electrical and electronic equipment will occur in the atmosphere, which is essential to cut the power to prevent the waste of power by power measurement technology development and to develop the technology to do this operation is the main core of standby power to detect and block it and return the configured for software and hardware, while the actual construction to ensure stability through field testing and debugging of problems improved accordingly, as well as ease of installation and so it could be done while the test. In addition, in terms of basic hardware switching of standby power when blocking, reducing stress and ensure stable operation and circuit design, power off and back to ensure stable operation even when a protection circuit is applied.
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Regular Paper : Semiconductor ; Study on Design of 60 V TDMOSFET for Protection Circuit Module
Hyun Woong Lee, Eun Sik Jung, Reum Oh, Man Young Sung
J Electr Electron Mater 2012;25(5):340-344.   Published online May 1, 2012
Protected Circuit Module protects battery from over-charge and over-discharge, also prevents accidental explosion. Therefore, power MOSFET is essential to operate as a switch within the module. To reduce power loss of MOSFET, the on state voltage drop should be lowered and the switching time should be shorted. However there is trade-off between the breakdown voltage and the on state voltage drop. The TDMOS can reduce the on state voltage drop. In this paper, effect of design parameter variation on electrical properties of TDMOS, were analyzed by computer simulation. According to the analyzed results, the optimization was performed to get 65% higher breakdown voltage and 17.4% on resistance enhancement.
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Regular Paper : Semiconductor ; Characterization of Surface Textured Silicon Substrates by SF6/O2 Gas Mixture
Min Seok Kang, Sung Jae Joo, Sang Mo Koo
J Electr Electron Mater 2012;25(5):345-348.   Published online May 1, 2012
The optical losses associated with the reflectance of incident radiation are among the most important factors limiting the efficiency of a solar cell. Therefore, photovoltaic cells normally require special surface structures or materials, which can reduce reflectance. In this study, nano-scale textured structures with anti-reflection properties were successfully formed on silicon. The surface of sicon wafer was etched by the inductively coupled plasma process using the gaseous mixture of SF6+O2. We demonstrate that the reflection characteristic has significantly reduced by ∼0% compared with the flat surface. As a result, the power efficiency Pmax of the nano-scale textured silicon solar cell were enhanced up to 20%, which can be ascribed primarily to the improved light trapping in the proposed nano-scale texturing.
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Regular Paper : Semiconductor ; Photoluminescence Characteristics of ZnO Nanowires Grown on a-, c- and m-plane Oriented 4H-SiC Substrates
Ik Ju Kim, In Hyung Yer, Byung Moo Moon, Min Seok Kang, Sang Mo Koo
J Electr Electron Mater 2012;25(5):349-352.   Published online May 1, 2012
ZnO thin films were deposited on a-, c- and m- plane oriented 4H-SiC substrates by pulsed laser deposition. ZnO nanowires were formed on substrates by tube furnace. Shape and density of the ZnO nanowires were investigated by field emission scanning electron microscope. Average surface roughness and root mean square surface roughness were measure by atomic force microscope. Optical properties were investigated by Photoluminescence measurement. Density of ZnO nanowires grown on a-, c- and m-plane oriented 4H-SiC substrates were 17.89 μm-2, 9.98 μm-2 and 2.61 μm-2, respectively.
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Regular Paper : Semiconductor ; Nitride/Oxide Etch Spectrum Data Verification by Using Optical Emission Spectroscopy
Soo Kyoung Park, Dong Hyun Kang, Seung Soo Han, Sang Jeen Hong
J Electr Electron Mater 2012;25(5):353-360.   Published online May 1, 2012
As semiconductor device technology continuously shrinks, low-open area etch process prevails in front-end etch process, such as contact etch as well as one cylindrical storage (OCS) etch. To eliminate over loaded wafer processing test, it is commonly performed to emply diced small coupons at stage of initiative process development. In nominal etch condition, etch responses of whole wafer test and coupon test may be regarded to provide similar results; however, optical emission spectroscopy (OES) which is frequently utilize to monitor etch chemistry inside the chamber cannot be regarded as the same, especially etch mask is not the same material with wafer chuck. In this experiment, we compared OES data acquired from two cases of etch experiments; one with coupon etch tests mounted on photoresist coated wafer and the other with coupons only on the chuck. We observed different behaviors of OES data from the two sets of experiment, and the analytical results showed that careful investigation should be taken place in OES study, especially in coupon size etch.
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Viscosity Sensor Using Piezoelectric Ceramic Resonators
Yun Po Ok, Jin Kyu Kang, Chang Hyo Hong, Jae Shin Lee
J Electr Electron Mater 2012;25(5):361-365.   Published online May 1, 2012
A bolt-clamped ultrasonic viscometer was designed and fabricated using a pair of ring-shaped piezoelectric ceramic resonators. For its compactness and low operation frequencies, simulation of piezoelectric resonators was carried out using an ATILA program. Ring-shaped resonators using 0.05Pb(Mn1/3Sb2/3)O3-0.95Pb(Zr0.475Ti0.525)O3 ceramics were prepared by a conventional ceramic processing, which were then clamped with a pair of metal caps. The fabricated sensor module with a small volume of less than 1 cm3 and an operation frequency as low as 26.5 kHz showed a good relationship between its quality factor and the viscosity of oil.
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Regular Paper : Thin Films and Sensors ; A Study on the MDTF for Uncooled Infrared Ray Thermal Image Sensors with High Thermal Coefficient of Resistance
Eun Sik Jung, Se Jin Jeong, Ey Goo Kang, Man Young Sung
J Electr Electron Mater 2012;25(5):366-371.   Published online May 1, 2012
In this paper, fabricated by MEMS uncooled micro-bolometer detector for the study in the infrared sensitivity enhancement. Absorption layer SiOx-Metal series MDTF (metal-dielectric thin film) by high absorption rate and has a high thermal coefficient of resistance, low noise characteristics were implemented. Then MDTF were made in a vacuum deposition method. And MDTF for the analysis of the physical properties of silicon wafers were fabricated, TCR (temperature coefficient of resistance) value was made in order to measure the glass wafer and FT-IR (Fourier Transform Infrared spectroscopy) values were made in order to measure the germanium window. The analyzed results of MDTF -3 [%/K] has more characteristics of the TCR. And 8∼12 um wavelength region close to 70% in the absorption characteristic.
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Regular Paper : Thin Films and Sensors ; Analysis of the Electrical Properties of Solar Cell According to Variation of the Frequency
Seong Geol Kim, Chang Woo Hong, Kyung Sup Lee
J Electr Electron Mater 2012;25(5):372-376.   Published online May 1, 2012
This study focused on the performance characteristics of solar cell using the impedance technique. We measured an impedance according to frequency from 1 Hz until 1 MHz. It could know that the impedance was decreased according to the frequency increases in solar cell. The impedance of single crystal solar cell was 0.61 Ω at 1 Hz, and kept almost settled value to 1×10(2) Hz. However, the impedance of polycrystal solar cell was 7×10(3) Ω at 1 Hz.
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Overlapping Rates of Laser Spots on the Laser Direct Patterning of ITO Electrode in the Double-Layer Structure of Thin Film
Jian Xun Wang, Jung Cheul Park, Sang Jik Kwon, Eou Sik Cho
J Electr Electron Mater 2012;25(5):377-380.   Published online May 1, 2012
Laser direct patterning of indium tin oxide(ITO) is one of new methods of direct etching process to replace the conventional photolithography. A diode pumped Q-switched Nd:YVO4 (λ= 1,064 nm) laser was used to produce ITO electrode on various transparent oxide semiconductor films such as zinc oxide(ZnO). The laser direct etched ITO patterns on ZnO were compared with those on glass substrate and were considered in terms of the overlapping rate of laser beam. In case of the laser etching on double-layer, it was possible to obtain the higher overlapping rate of laser beam.
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Encapsulation Method of OLED with Organic-inorganic Protective Thin Films Sealed with Flat Glass
Min Kyung Park, Sung Hoo Ju
J Electr Electron Mater 2012;25(5):381-386.   Published online May 1, 2012
To study encapsulation method for large-area organic light emitting diodes (OLEDs), red emitting OLEDs were fabricated, on which Alq3 as organic buffer layer and LiF and Al as inorganic protective layers were deposited to protect the damage of OLED by epoxy. And then the OLEDs were attached to flat glass by printing method using epoxy. The basic structure of OLED doped with rubrene of 1 vol.% as emitting layer is ITO(150 ㎚)/2-TNATA(50 ㎚)/α-NPD(30 ㎚)/Alq3:Rubrene(30 ㎚)/Alq3(30 ㎚)/LiF(0.7 ㎚)/Al(100 ㎚). In case of depositing Alq3, LiF and Al and then attaching of flat glass onto OLED, current density, luminance, efficiency and driving voltage were not changed and lifetime was increased according to thickness of Al as inorganic protective layers. The lifetime of OLED/Alq3/LiF/Al_4/glass structure was 139 hours increased by 15.8 times more than bare OLED of 8.8 hours and 1.6 times more than edge sealed OLED of 54.5 hours.
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Regular Paper : Nano Materials and Devices ; Bending Properties of the Flexible BMNO (Bi2Mg2/3Nb3/4O7) Capacitor Using Graphene Electrode
Hyun A Song, Byeong Ju Park, Soon Gil Yoon
J Electr Electron Mater 2012;25(5):387-391.   Published online May 1, 2012
Graphene was fabricated onto Ni/Si substrate using a rapid-thermal pulse CVD and they were transferred onto the Ti/PES flexible substrate. For top electrode applications of the BMNO dielectric films, graphene was patterned using a argon plasma. Through an AFM image and a leakage current density of the BMNO films grown onto various bottom electrodes before and after bending test, BMNO films grown onto the graphene bottom electrode showed no change of the microstructure and the leakage current density after the bend.
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Regular Paper : Energy Materials ; Synthesis and Densification Behavior of Al Doped (La0.8Ca0.2)(Cr0.9Co0.1)O3(LCCC) Ceramics for SOFC Interconnects
Ho Young Lee, Bo Kyung Kang, Ho Chang Lee, Young Woo Heo, Jeong Joo Kim, Jae Yuk Kim, Joon Hyung Lee
J Electr Electron Mater 2012;25(5):392-397.   Published online May 1, 2012
In the (La0.8Ca0.2)(Cr0.9Co0.1)O3 (LCCC), which has been using as interconnector materials in SOFC, Al ions were substituted for Co because ionic radius of Al is similar to that of Co. Because of the almost identical ionic radius of Al and Co, the substitution was not thought to be affect the tolerance factor of LCCC, and the densification behavior, high temperature electrical conductivity and thermal expansion coefficient were examined as a function of Al concentration. In the cases of the x= 0 and x= 0.02 in (La0.8Ca0.2)(Cr0.9Co0.1-xAlx)O3 (x= 0∼0.1), the samples showed the relative densities above ≥95% when those were sintered at ≥1,350℃. In the case of the x≥0.06 the sintered density deteriorated greatly at lower sintering temperatures. High temperature electrical conductivity of the samples decreased as the content of Al increased. Since the valence state of Al ion is unchangeable, while Cr or Co ions contribute to the electrical conduction by changing those valence states, Al substitution resulted in the decreased electrical conductivity. Al doping of LCCC was an effective way of decreasing the thermal expansion coefficient (TEC).
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Regular Paper : Energy Materials ; Synthesis of Li2MnSiO4 by Solid-state Reaction
Ji Su Kim, Joong Pyo Shim, Gyung Se Park, Ho Jung Sun
J Electr Electron Mater 2012;25(5):398-402.   Published online May 1, 2012
Synthesis of Li2MnSiO4 was attempted by the conventional solid-state reaction method, and the phase formation behavior according to the change of the calcination condition was investigated. When the mixture of the three source materials, Li2O, MnO and SiO2 powders, were used for calcination in air, it was difficult to develop the Li2MnSiO4 phase because the oxidation number of Mn2+ could not be maintained. Therefore, two-step calcination was applied: Li2SiO3 was made from Li2O and SiO2 at the first step, and Li2MnSiO4 was synthesized from Li2SiO3 and MnO at the second step. It was easy to make Li2SiO3 from Li2O and SiO2. Li2MnSiO4 single phase was developed by the calcination at 900℃ for 24 hr in Ar atmosphere as the oxidation of Mn2+ was prevented. However, the Li2MnSiO4 was γ -Li2MnSiO4, one of the polymorph of Li2MnSiO4, which could not be used as the cathode materials in Li-ion batteries. By applying the additional low temperature annealing at 400℃, the single phase β -Li2MnSiO4 powder was synthesized successfully through the phase transition from γ to β phase.
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Regular Paper : Technology Education ; Research on the Improvement of Convergence Characteristics of the Fast Decoupled Load Flow
In Yong Lee
J Electr Electron Mater 2012;25(5):403-408.   Published online May 1, 2012
In this paper, we propose useful load flow algorithms called FEDL (fast enhanced decoupled load flow). The proposed load flow method can improve the convergence characteristics particularly when the P-Q coupling becomes significant and the power system operating states deviate from the conditions required for stable convergence of the FDL by reflecting in part the effects of the off-diagonal terms in the Jacobian. In our test with IEEE AEP-30 bus system and RTS-96 73-bus system, it converge even when the fast decoupled load flow (FDL) and its variations keeping load flow matrices constant experience convergence problems. Test results show promising performances of the proposed algorithms in their convergence characteristics both in number of iterations and overall convergence speeds.
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