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Volume 22(6); June 2009

Reduction of Barrier Height between Ni-silicide and P+ Source/drain for High Performance PMOSFET
Sun Kyu Kong, Ying Ying Zhang, Kee Young Park, Shi Guang Li, Soon Yen Jung, Hong Sik Shin, Ga Won Lee, Jin Suk Wang, Hi Deok Lee
J Korean Inst Electr Electron Mater Eng 2009;22(6):457-461.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.457
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Schottky Barrier Thin Film Transistor by using Platinum-silicided Source and Drain
Jin Wook Shin, Hong Bay Chung, Young Hie Lee, Won Ju Cho
J Korean Inst Electr Electron Mater Eng 2009;22(6):462-465.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.462
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Tunneling Properties in High-K Insulators with Engineered Tunnel Barrier for Nonvolatile Memory
Se Man Oh, Myung Ho Jung, Gun Ho Park, Kwan Su Kim, Hong Bay Chung, Young Hie Lee, Won Ju Cho
J Korean Inst Electr Electron Mater Eng 2009;22(6):466-469.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.466
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Change in Electrical Properties of Al2O3/Gan MIS Structures according to the Thickness of Al2O3 Thin Film and Annealing Temperature
No-Won Kwak, Woo Seok Lee, Ka Lam Kim, Hyun Jun Kim, Kwang Ho Kim
J Korean Inst Electr Electron Mater Eng 2009;22(6):470-475.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.470
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A Calculation of the Cosmic Radiation Dose of a Semiconductor in a Geostationary Orbit Satellite Depending on the Shield Thickness
Jeong Hwan Heo, Bong Jin Ko, Bum Jin Chung
J Korean Inst Electr Electron Mater Eng 2009;22(6):476-483.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.476

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Citations to this article as recorded by  
  • Modeling of paths and energy losses of high-energy ions in single-layered and multilayered materials
    D I Tishkevich, S S Grabchikov, E A Grabchikova, D S Vasin, S B Lastovskiy, A S Yakushevich, D A Vinnik, T I Zubar, I V Kalagin, S V Mitrofanov, D V Yakimchuk, A V Trukhanov
    IOP Conference Series: Materials Science and Engineering.2020; 848(1): 012089.     CrossRef
  • Radiation Exposure of an Astronaut subject to Various Space Radiation Environments and Shielding Conditions
    Myeong-Seon Chae, Bum-Jin Chung
    Journal of the Korean Society for Aeronautical & Space Sciences.2010; 38(10): 1038.     CrossRef
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Dielectric and Piezoelectric Properties of (Na,K)NbO3 Ceramics as a Function of SrTiO3 Substitution
Sang Ho Lee, Ju Hyun Yoo, Yeu Yong Lee, Hyun Seon Song, Suk Burm Mah, Seong Goo Kim
J Korean Inst Electr Electron Mater Eng 2009;22(6):484-488.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.484

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  • Improving Sensitivity of the Pyroelectric Infrared Flame Detector
    Hyun Seon Song, Yeu Yong Lee
    Journal of the Korean Institute of Illuminating and Electrical Installation Engineers.2015; 29(4): 77.     CrossRef
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Dielectric and Piezoelectric Properties of 0.95(K0.5Na0.5)NbO3-0.05Li(Sb0.8Nb0.2)O3 Ceramics according to the Amount of CuO Addition
Yu Hyung Lee, Do Hyung Kim, Ju Hyun Yoo, In Sung Kim, Jae Sung Song, Jae Il Hong
J Korean Inst Electr Electron Mater Eng 2009;22(6):489-494.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.489
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Effect of Ceramic Powder Content and Shape on the Electrical Properties of Ceramic(BaTiO3)-polymer(Epoxy) Composite for Embedded Capacitors
Jeong Woo Han, Jung Rag Yoon, Hae June Je, Dong Ho Lee, Kyung Min Lee
J Korean Inst Electr Electron Mater Eng 2009;22(6):495-500.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.495
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Enhanced Dispersion of High Performance Dye-sensitized Solar Cells
En Mei Kim, Kyung Hee Park, Hal Bon Gu, Bok Kee Park
J Korean Inst Electr Electron Mater Eng 2009;22(6):501-505.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.501
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Refractive Indices and Densities of B2O3-Al2O3-SiO2 Glass System for Photosensitive Barrier Ribs of Plasma Display Panel
Ju Yeon Won, Seong Jin Hwang, Sang Ho Lee, Hyung Sun Kim
J Korean Inst Electr Electron Mater Eng 2009;22(6):506-511.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.506
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Electrical and Optical Properties of Partially Doped Blue Phosphorescent OLEDs
Yu Seok Seo, Dae Gyu Moon
J Korean Inst Electr Electron Mater Eng 2009;22(6):512-515.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.512
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Characteristic Analysis of X-ray Device using the High Voltage Generator on Full-wave Rectification Method
Young Pyo Kim, Tae Gon Kim, Ho Shik Lee, Yong Pil Park, Min Woo Cheon
J Korean Inst Electr Electron Mater Eng 2009;22(6):516-521.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.516
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Analysis of Fault Current Limiting Characteristics According to Variation of Inductances in Separated Three-phase Flux-Lock Type SFCL
Seung Gyu Doo, Ho Ik Du, Min Ju Kim, Chung Ryul Park, Yong Jin Kim, Dong Hyeok Lee, Byoung Sung Han
J Korean Inst Electr Electron Mater Eng 2009;22(6):522-525.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.522
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Safety Analysis for Passengers of Composite Car-body against Lightning Strikes
Gyung Suk Kil, Dae Won Park, Sung Wook Kim, Chan Yong Park, Young Jin Cho
J Korean Inst Electr Electron Mater Eng 2009;22(6):526-531.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.526
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Capacity Change of Supercapacitor by Surface Treatment of Carbon Nanotubes
Yong Tae Kim
J Korean Inst Electr Electron Mater Eng 2009;22(6):532-536.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.532
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Development of Parameters on Depth of Anesthesia using Power Spectrum Density Analysis during General Anesthesia
Seong Wan Baik, Soo Young Ye, Jun Mo Park, Gye Rok Jeon
J Korean Inst Electr Electron Mater Eng 2009;22(6):537-545.   Published online June 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.6.537

Citations

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  • Deep learning based depth of anaesthesia monitoring using EEG: a 4-layer CNN model with PSD and BSR correlation features
    M. S. Thasneem, K. R. Remesh Babu
    Physical and Engineering Sciences in Medicine.2026;[Epub]     CrossRef
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