Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

12
results for

"Package"

Keywords

Publication year

Authors

"Package"

Defect Prediction Using Machine Learning Algorithm in Semiconductor Test Process
Suyeol Jang, Mansik Jo, Seulki Cho, Byungmoo Moon
J Electr Electron Mater 2018;31(7):450-454.   Published online November 1, 2018
Because of the rapidly changing environment and high uncertainties, the semiconductor industry is in need of appropriate forecasting technology. In particular, both the cost and time in the test process are increasing because the process becomes complicated and there are more factors to consider. In this paper, we propose a prediction model that predicts a final “good” or “bad” on the basis of preconditioning test data generated in the semiconductor test process. The proposed prediction model solves the classification and regression problems that are often dealt with in the semiconductor process and constructs a reliable prediction model. We also implemented a prediction model through various machine learning algorithms. We compared the performance of the prediction models constructed through each algorithm. Actual data of the semiconductor test process was used for accurate prediction model construction and effective test verification.
  • 9 View
  • 0 Download
A Comparison Study Between International Standard and Statistical Analysis on LED Package Life
Se Il Park, Gun So Kim, Chung Hyeok Kim
J Electr Electron Mater 2018;31(2):122-127.   Published online February 1, 2018
In an attempt to estimate the life projection of LED packages, IESNA published a paper regarding an LED package measurement test method in 2008, and a life projection technical document in 2011, to be used for LED life estimation. IESNA’s publications regarding LED package measurement methods were functional, but they were not internationally standardized before 2017. In order to develop a standardized method, the International Standard chose to use the LM-80 as a measurement method for LED life projection in their publication in 2017. Many projection methods have been discussed by the IEC Technical Committee 34 working group, including the method using an exponential function, which reflects lumen degradation characteristics well. This study is designed to explore alternative LED package life estimation methods using an exponential function with statistical analysis, other than the one suggested by the International Standard.
  • 7 View
  • 0 Download
Regular Paper : Study on Chip on Chip Technology for Minimizing LED Driver Ics
Ey Goo Kang
J Electr Electron Mater 2016;29(3):131-134.   Published online March 1, 2016
This research was analyzed thermal characteristics that was appointed disadvantage when smart LED driver ICs was packaged and we applied extracted thermal characteristics for optimal layout design. We confirmed reliability of smart LED driver ICs package without additional heat sink. If the package is not heat sink, we are possible to minimize package. For extracting thermal loss due to overshoot current, we increased driver current by two and three times. As a result of experiment, we obtained 22 mW and 49.5 mW thermal loss. And we obtained optimal data of 350 mA driver current. It is important to distance between power MOSFET and driver ICs. If thhe distance was increased, the temperature of package was decreased. And so we obtained optimal data of 3.7 mm distance between power MOSFET and driver ICs. Finally, we fabricated real package and we analyzed the electrical characteristics. We obtained constant 35 V output voltage and 80% efficiency.
  • 12 View
  • 0 Download
Regular Paper : Study on Thermal Characteristics of Smart LED Driver ICs Package
Ey Goo Kang
J Electr Electron Mater 2016;29(2):79-83.   Published online February 1, 2016
This research was analyzed thermal characteristics that was appointed disadvantage when smart LED driver ICs was packaged and we applied extracted thermal characteristics for optimal layout design. We confirmed reliability of smart LED driver ICs package without additional heat sink. If the package is not heat sink, we are possible to minimize package. For extracting thermal loss due to overshoot current, we increased driver current by two and three times. As a result of experiment, we obtained 22 mW and 49.5 mW thermal loss. And we obtained optimal data of 350 mA driver current. It is important to distance between power MOSFET and driver ICs. If thhe distance was increased, the temperature of package was decreased. And so we obtained optimal data of 3.7 mm distance between power MOSFET and driver ICs. Finally, we fabricated real package and we analyzed the electrical characteristics. We obtained constant 35 V output voltage and 80% efficiency.
  • 10 View
  • 0 Download
Optical Properties of Color Conversion Lens for White LED Using B2O3-Bi2O3-ZnO Glass
Yoo Jin Chae, Mi Jai Lee, Jin Ho Kim, Jong Hee Hwang, Tae Young Lim, Hee Suk Jeong, Young Sik Lee, Deuk Jung Kim
J Electr Electron Mater 2013;26(8):614-619.   Published online August 1, 2013
Recently, remote phosphor is reported for white LED enhancing of phosphor efficiency compared with conventional phosphor-based W-LED. In this study, Remote phosphor was produced by screen printing coating on glass substrate with phosphor contents rated paste and heat treatment. The paste consists of phosphor, lowest softening glass frit and organic binders. Remote phosphor can be well controlled by varying the phosphor content rated paste. After mounting remote phosphor on top of blue LED chip, CCT, CRI, and luminance efficiency were measured. The measurement results showed that CCT, CRI. and luminance efficiency were 6,645, 68, and 1,161 n/W in phosphor 80 wt.% remote phosphor sintered at 600℃.
  • 8 View
  • 0 Download
Light Source and Application Technology : Regular Paper ; Evaluation of White LED Package Characteristics in Remote Phosphor Structure Depending on Phosphor Coatings
Hee Suk Jeong, Jung Geun Lee, Han Lim Kang, Myung Keun Hwang, Mi Jae Lee, Jin Ho Kim, Yoo Jin Chae, Young Sik Lee
J Electr Electron Mater 2013;26(4):330-334.   Published online April 1, 2013
We developed a package of remote phosphor structure having blue LED chips and phosphors physically separated, and the characteristics were evaluated according to different classifications of phosphor coatings. Remote phosphor was produced by screen printing coating on glass substrate with phosphor content rated paste and heat treatment. After mounting Remote phosphor, which has been classified according to number of coatings, on top of blue LED chips, luminous flux, luminous efficacy, CCT and CRI were measured. The measurement results showed the most suitable characteristics of white LED package as a general light source when the content rate of phosphor in Remote phosphor was 80 wt.% with 3 layers of coatings and thickness over 12 μm.
  • 9 View
  • 0 Download
A Study on Thermosonic Bonding Process and Its Reliability Evaluation of Joints
Young Eui Shin, Jin Suk Park, Sun Eik Son
J Electr Electron Mater 2009;22(8):625-631.   Published online August 1, 2009
  • 9 View
  • 0 Download
Manufacture of Surface Mounted Device Type Fast Recovery Diode with Ceramic Package
J Electr Electron Mater 2007;20(5):415-420.   Published online May 1, 2007
  • 8 View
  • 0 Download
Light Enhancement Al2O3 Passivation in InGaN/GaN based Blue Light-emitting Diode Lamps
Soon Jin So, Kyeong Min Kim, Choon Bae Park
J Electr Electron Mater 2006;19(8):775-779.   Published online August 1, 2006
  • 8 View
  • 0 Download
Wafer Burn-in Method for SRAM in Multi Chip Package
J Electr Electron Mater 2005;18(6):506-509.   Published online June 1, 2005
  • 10 View
  • 0 Download
Optical Devices : Electron Emission From Porous Poly-Silicon Nano-Device for Flat Panel Display
Joo Won Lee, Hoon Kim, Yun Hi Lee, Jin Jang, Byeong Kwon Ju
J Electr Electron Mater 2003;16(4):330-335.   Published online April 1, 2003
  • 8 View
  • 0 Download
Wafer Level Packaging of RF-MEMS Devices with Vertical Feed-through
Yong Gug Kim, Yun Gwon Park, Jae Gyeong Kim, Byeong Gwon Ju
J Electr Electron Mater 2003;16(12s):1237-1241.
  • 7 View
  • 0 Download