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Single Junction Charge Pumping 방법을 이용한 전하 트랩형 SONOSFET NVSM 셀의 기억 트랩분포 결정

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Determination of Memory Trap Distribution in Charge Trap Type SONOSFET NVSM Cells Using Single Junction Charge Pumping Method

Jeon Woo Yang, Soon Hyuk Hong, Kwang Yell Seo
J Electr Electron Mater 2000;13(10):822-827.
Published online: October 1, 2000
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Determination of Memory Trap Distribution in Charge Trap Type SONOSFET NVSM Cells Using Single Junction Charge Pumping Method
J Electr Electron Mater. 2000;13(10):822-827.   Published online October 1, 2000
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Include:
Determination of Memory Trap Distribution in Charge Trap Type SONOSFET NVSM Cells Using Single Junction Charge Pumping Method
J Electr Electron Mater. 2000;13(10):822-827.   Published online October 1, 2000
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