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Aging 효과가 Sol-gel 공정 기반 CuO 박막 트랜지스터의 전기적 특성에 미치는 영향

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Aging Effects on Electrical Characteristics of Sol-gel Processed CuO Thin Film Transistors

Jaewon Jang
J Electr Electron Mater 2016;29(9):527-531.
Published online: September 1, 2016
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In this study, p-type thin film transistors consisting of CuO channels were fabricated by sol-gel process, with copper (II) acetate monohydrate precursors. At 500℃, the deposited films were fully converted into monoclinic phase CuO. The fabricated CuO thin film transistors deliver field effect mobility in saturation regime of 0.015㎠/Vs, and Ion/Ioff of ~10³. The degradation of the performance of the fabricated CuO thin film transistor caused by the exposure to air has been studied.

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Aging Effects on Electrical Characteristics of Sol-gel Processed CuO Thin Film Transistors
J Electr Electron Mater. 2016;29(9):527-531.   Published online September 1, 2016
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
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Aging Effects on Electrical Characteristics of Sol-gel Processed CuO Thin Film Transistors
J Electr Electron Mater. 2016;29(9):527-531.   Published online September 1, 2016
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