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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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Indium-Zinc 산화물 박막 트랜지스터 기반의 N-MOS 인버터

김한상, 김성진

Indium-Zinc Oxide Thin Film Transistors Based N-MOS Inverter

Han-sang Kim, Sung-jin Kim
J Electr Electron Mater 2017;30(7):437-440.
Published online: July 1, 2017
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We report on amorphous thin-film transistors (TFTs) with indium zinc oxide (IZO) channel layers that were fabricated via a solution process. We prepared the IZO semiconductor solution with 0.1 M indium nitrate hydrate and 0.1 M zinc acetate dehydrate as precursor solutions. The solution- processed IZO TFTs showed good performance: a field-effect mobility of 7.29 ㎠/Vs, a threshold voltage of 4.66 V, a subthreshold slope of 0.48 V/dec, and a current on-to-off ratio of 1.62×105. To investigate the static response of our solution-processed IZO TFTs, simple resistor load-type inverters were fabricated by connecting a 2-MΩ resistor. Our IZOTFTbased N-MOS inverter performed well at operating voltage, and therefore, isa good candidate for advanced logic circuits and display backplane.

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Indium-Zinc Oxide Thin Film Transistors Based N-MOS Inverter
J Electr Electron Mater. 2017;30(7):437-440.   Published online July 1, 2017
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Indium-Zinc Oxide Thin Film Transistors Based N-MOS Inverter
J Electr Electron Mater. 2017;30(7):437-440.   Published online July 1, 2017
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