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Degradation Characteristics of Mobility in Channel of P-MOSFET's by Hot Carriers

Yong Jae Lee
J Electr Electron Mater 1998;11(1):26-32.
Published online: January 1, 1998
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Degradation Characteristics of Mobility in Channel of P-MOSFET's by Hot Carriers
J Electr Electron Mater. 1998;11(1):26-32.   Published online January 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Degradation Characteristics of Mobility in Channel of P-MOSFET's by Hot Carriers
J Electr Electron Mater. 1998;11(1):26-32.   Published online January 1, 1998
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