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Keywords
STACIR/AW conductor (2)
Strand wire (2)
ZnO (2)
(Zn0.8Mg0.2)TiO3 (1)
1/f noise (1)
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Keywords
STACIR/AW conductor (2)
Strand wire (2)
ZnO (2)
(Zn0.8Mg0.2)TiO3 (1)
1/f noise (1)
Al clad invar (1)
B2O3 (1)
Breakdown voltage (1)
Carbon nanotube (1)
Carrier Lifetime (1)
Contact angle (1)
Contamination (1)
Cool-down (1)
Cycle Life (1)
Defect (1)
Delta-doping (1)
Dielectric Layer (1)
Diode (1)
Elastic modulus (1)
Electromechanical coupling factor (1)
Electron beam (1)
Encapsulation (1)
EOT (1)
Equivalent oxide thickness (1)
Ester (1)
Evanohm R (1)
Fatigue (1)
FTS (1)
Hydrophobicity (1)
In-situ FED (1)
INVAR/AW (1)
Iron oxide (1)
ITO cathode (1)
LDMOSFET (1)
Li-ion secondary battery (1)
LiCoO2 (1)
LiNi1/3Mn1/3Co1/3O2 (1)
Low-temperature sintering (1)
Mechanical quality factor (1)
Metal-insulator-semiconductor (1)
Microwave dielectric properties (1)
Migration (1)
MIS (1)
Mixed cathode (1)
MOSFET (1)
Multilayer piezoelectric actuator (1)
Nanonail (1)
Nanorod (1)
Oblique field (1)
On-resistance (1)
Parelene (1)
Piezoelectric d constant (1)
Power device (1)
Proton (1)
Rapid thermal annealing (1)
Rate capability (1)
Reactive RF magnetron sputtering (1)
Rocking curve (1)
RTA (1)
Rutile (1)
Screen printing (1)
Sealing (1)
SiGe (1)
Sintering aid (1)
SiO2 (1)
Soybean oil (1)
Surface resistivity (1)
Surface-doped (1)
TCR (1)
Temperature coefficient of resistance (1)
Thermal annealing (1)
Thermal evaporation (1)
Thermal expansion coefficient (1)
Thermal resistance (1)
Thin film resistor (1)
TOLED (1)
Transesterification (1)
Transformer (1)
Transmissive Liquid crystal display (1)
Ultrasonic resonator (1)
Ultrasonic spray pyrolysis (1)
XPS (1)
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Previous issues
Volume 19(1); January 2006
Low-frequency Noise Characteristics of Si0.8Ge0.2 pMOSFET Depending upon Channel Structures and Bias Conditions
J Korean Inst Electr Electron Mater Eng
2006;19(1):1-6.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.001
PDF
28
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0
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Current-voltage Characteristics of Proton Irradiated NPT Type Power Diode
J Korean Inst Electr Electron Mater Eng
2006;19(1):7-12.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.007
PDF
40
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0
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Shape Control and Characterization of One-dimensional ZnO Nanostructures through the Synthesis Procedure
J Korean Inst Electr Electron Mater Eng
2006;19(1):13-17.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.013
PDF
27
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0
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Temperature Dependence on Electrical Characterization of Epitaxially Grown AlN Film on 6H-SiC Structures
J Korean Inst Electr Electron Mater Eng
2006;19(1):18-22.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.018
PDF
47
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0
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Breakdown Voltage and On-resistance Characteristics of the Surface Doped SOI RESURF LDMOSFET
J Korean Inst Electr Electron Mater Eng
2006;19(1):23-28.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.023
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33
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0
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Low Temperature Sintering of B2O3-added (Zn0.8Mg0.2)TiO3 Microwave Dielectric Ceramics
J Korean Inst Electr Electron Mater Eng
2006;19(1):29-34.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.029
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30
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0
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Piezoelectric and Dielectric Characteristics of Low Temperature Sintering Pb(Mn1/3Nb2/3)O3-Pb(Ni1/3Nb2/3)O3-Pb(Zr1/2Ti1/2)O3 Ceramics according to Pb(Ni1/3Nb2/3)O3 Substitution
J Korean Inst Electr Electron Mater Eng
2006;19(1):35-39.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.035
PDF
Citations
Citations to this article as recorded by
Structural Properties of Pb(Zr
0.52
Ti
0.38
Li
0.1
)O
3
Prepared via High Planetary Mill
Maliha Siddiqui, Julie Juliewatty Mohamed, Zainal Arifin Ahmad
Materials Science Forum.2017; 888: 91.
CrossRef
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Synthesis and Characterization of Soybean-based Ester Insulation Oils
J Korean Inst Electr Electron Mater Eng
2006;19(1):40-45.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.040
PDF
37
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0
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Effects of Added Silicone Oils on the Surface Hydrophobicity of Silicone Rubber
J Korean Inst Electr Electron Mater Eng
2006;19(1):46-51.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.046
PDF
31
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0
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Manufacture of Precision Thin Film Resistors using Ni-Cr Alloy and Their Properties
J Korean Inst Electr Electron Mater Eng
2006;19(1):52-57.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.052
PDF
40
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0
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Preparation of Iron Oxide-mixed ZnO Films by Ultrasonic Spray Pyrolysis
J Korean Inst Electr Electron Mater Eng
2006;19(1):58-63.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.058
PDF
35
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0
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A Study on Electrochemical Characteristics of LiCoO2/LiNi1/3Mn1/3Co1/3O2 Mixed Cathode for Li Secondary Battery
J Korean Inst Electr Electron Mater Eng
2006;19(1):64-70.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.064
PDF
37
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0
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Characteristics of Defects in SiOx Thin Films on Ethylene Terephthalate by High-temperature E-beam Deposition
J Korean Inst Electr Electron Mater Eng
2006;19(1):71-74.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.071
PDF
36
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0
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Field Emission Characteristics of a CNT-FEA Fabricated by Screen-printing of a Photo-sensitive CNT Paste
J Korean Inst Electr Electron Mater Eng
2006;19(1):75-80.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.075
PDF
35
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0
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Electro-optic Characteristic of Homogeneously Aligned Liquid Crystal Display Driven by an Oblique Field
J Korean Inst Electr Electron Mater Eng
2006;19(1):81-86.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.081
PDF
32
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0
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Dependence on the Oxygen Gas of ITO Thin Film for TOLED by Facing Targets Sputtering Method
J Korean Inst Electr Electron Mater Eng
2006;19(1):87-90.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.087
PDF
32
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0
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Effect of Aging on Fatigue of Al Clad INVAR Core Wire for High Capacity and Low Sag(STACIR/AW) Conductor (1)
J Korean Inst Electr Electron Mater Eng
2006;19(1):91-99.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.091
PDF
38
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0
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Effect of Mechanical Properties by a Long Term Operation in High Capacity and Low Sag Conductor (2)
J Korean Inst Electr Electron Mater Eng
2006;19(1):100-106.
Published online January 1, 2006
DOI:
https://doi.org/10.4313/JKEM.2006.19.1.100
PDF
41
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0
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