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Volume 18(12); December 2005

Study on the Silicon Nano-needle Structure for Nano Floating Gate Memory Application: J Korean Inst Electr Electron Mater Eng 2005;18(12):1069-1074. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1069

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Electrical Characterization of Nano SOI Wafer by Pseudo MOSFET: J Korean Inst Electr Electron Mater Eng 2005;18(12):1075-1079. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1075

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Effect of Ge Redistribution and Interdiffusion during Si(1-x)Gex Layer Dry Oxidation: J Korean Inst Electr Electron Mater Eng 2005;18(12):1080-1086. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1080

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Electrical Properties of a Single ZnO Nanowire in a Four-probe Configuration: J Korean Inst Electr Electron Mater Eng 2005;18(12):1087-1091. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1087

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Evidence of Piezoelectric Potential and Screening Effect in Single Highly Doped ZnO:Ga and ZnO:Al Nanowires by Advanced Scanning Probe Microscopy
Oleksandr Synhaivskyi, David Albertini, Pierre Gaffuri, Jean-Michel Chauveau, Vincent Consonni, Brice Gautier, Georges Bremond
The Journal of Physical Chemistry C.2021; 125(28): 15373. CrossRef

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Carbon Nanotube Oscillator Operated by Thermal Expansion of Encapsulated Gases: J Korean Inst Electr Electron Mater Eng 2005;18(12):1092-1100. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1092

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Optical Properties of Er-implanted GaN: J Korean Inst Electr Electron Mater Eng 2005;18(12):1101-1105. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1101

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Multi-mode Planar Waveguide Fabricated by a (110) Silicon Hard Master: Yu Min Jung, Yeong Cheol Kim; J Korean Inst Electr Electron Mater Eng 2005;18(12):1106-1110. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1106

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(110) Silicon Hard Master Fabrication Using Wet Etching for Multi-Mode Planar Optical Splitter
Yu Min Jung, Yeong Cheul Kim, Hwa Il Seo
Key Engineering Materials.2006; 321-323: 1704. CrossRef

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Environmental Properties of ZnO Varistors with Variation of Sintering Temperature: J Korean Inst Electr Electron Mater Eng 2005;18(12):1111-1116. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1111

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Fabrication and Electrical Characteristics of ZnO Nano-powder Varistors: J Korean Inst Electr Electron Mater Eng 2005;18(12):1117-1123. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1117

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A Finite-element Method of a Multilayer Piezoelectric Body for an Actuator Depending on Inner Electrode Pattern: J Korean Inst Electr Electron Mater Eng 2005;18(12):1124-1128. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1124

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Optimum Design of EHF CPW using FDTD: J Korean Inst Electr Electron Mater Eng 2005;18(12):1129-1132. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1129

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Electrochemical Characteristics of Hybrid Capacitor and Pulse Performance of Hybrid Capacitor / Li-ion Battery: J Korean Inst Electr Electron Mater Eng 2005;18(12):1133-1138. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1133

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Study on Properties of OLEDs using Zn(HPB)2 as Hole Blocking Layer: J Korean Inst Electr Electron Mater Eng 2005;18(12):1139-1142. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1139

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Study on Characteristic by ITO Surface Treatment and Cathode Change of Organic Light Emitting Diodes: J Korean Inst Electr Electron Mater Eng 2005;18(12):1143-1147. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1143

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Properties in Organic Photovoltaic Cell Depending on the Exciton Blocking Layer Thickness: J Korean Inst Electr Electron Mater Eng 2005;18(12):1148-1151. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1148

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Development of High Strength and Low Loss Overhead Conductor(1) - Mechanical Properties: J Korean Inst Electr Electron Mater Eng 2005;18(12):1152-1158. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1152

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Development of High Strength and Low Loss Overhead Conductor(2) - Electric Properties: J Korean Inst Electr Electron Mater Eng 2005;18(12):1159-1165. Published online December 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.12.1159

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