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Volume 16(2); February 2003

Comparison of In-situ Er-doped GaN with Er-implanted GaN Using Photoluminescence and Photoluminescence Excitation Spectroscope: Hyun Suk Kim, Man Young Sung, Sang Sig Kim; J Korean Inst Electr Electron Mater Eng 2003;16(2):89-96. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.089

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A Study on the Diffusion Barrier Properties of Pt/Ti and Ni/Ti for Cu Metallization: Sung Keun Chang; J Korean Inst Electr Electron Mater Eng 2003;16(2):97-101. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.097

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Photovoltaic Properties of Cu(In,Ga)Se2 Thin Film Solar Cells Depending on Growth Temperature: Seok Ki Kim, Jeong Chul Lee, Ki Hwan Kang, Kyung Hoon Yoon, Jin Soo Song, I Jun Park, Sang Ok Man; J Korean Inst Electr Electron Mater Eng 2003;16(2):102-107. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.102

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Microwave Dielectric Constant Characteristics of (Al,Mg,Ta)O2 Solid Solutions with Crystal Structure and lonic Polarizability: J. W. Choi, J. Y. Ha, B. K. Ahn, Y. W. Park, S. J. Yoon, H. J. Kim; J Korean Inst Electr Electron Mater Eng 2003;16(2):108-112. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.108

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EL Properties of OLEDs with Different Crystal Structures of Hole Injection Layers of Copper(2)-phthalocyanine: Eun Ju Lim, Kie Jin Lee, Woo Mi Han, Jung Yoon E, Deok Joon Cha, Young San Lee, Jin Tae Kim; J Korean Inst Electr Electron Mater Eng 2003;16(2):113-119. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.113

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MEMS-based Micro Fluxgate Sensor Using Solenoid Excitation and Pick-up Coils: Kyoung Won Na, Hae Seok Park, Dong Sik Shim, Won Youl Choi, Jun Sik Hwang, Sang On Choi; J Korean Inst Electr Electron Mater Eng 2003;16(2):120-124. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.120

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Citations

Citations to this article as recorded by

Two-axis micro fluxgate sensor on single chip
Won-Youl Choi, Jong-Oh Kim
Microsystem Technologies.2006; 12(4): 352. CrossRef

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Photochemical Synthesis and Optical Properties of TiO2 Nanoparticles(1): Jae Hoon Jeong, Joeng Oh Moon, Byung Kee Moon, Se Mo Son, Su Tae Chung; J Korean Inst Electr Electron Mater Eng 2003;16(2):125-130. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.125

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Display : Electro-optic Characteristics of the Fringe-field Driven-reflective Liquid Crystal Display with One Polarizer: Tae Bong Jung, Chi Hyuck Park, John Moon Rhee, Yong Bai Kim, Seung Hee Lee; J Korean Inst Electr Electron Mater Eng 2003;16(2):131-137. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.131

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Display : Fully CMOS-compatible Process Integration of Thin Film Inductor with a Sputtered Bottom NiFe Core: II Yong Park, Sang Gi Kim, Jin Gun Koo, Tae Moon Roh, Dae Woo Lee, Jong Dae Kim; J Korean Inst Electr Electron Mater Eng 2003;16(2):138-143. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.138

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Optical Devices : Characteristics of the Photoinduced Anisotropy(PA) in Ag/AsGeSeS Multilayer Thin Films: Cheol Ho Yeo, Sun Woong Na, Kyun Shin, Jeong II Park, Hong Bay Chung; J Korean Inst Electr Electron Mater Eng 2003;16(2):144-150. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.144

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Dielectric Insulation Properties of Double Pancake Coil Type HTS Transformer: Seung Myeong Baek, Jong Man Jung, Hyun Soo Lee, Chul Su Han, Sang Hyun Kim; J Korean Inst Electr Electron Mater Eng 2003;16(2):151-156. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.151

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Superconducting Film Fabrication using Field Assisted Electrophoresis: Soh Dea Wha, Jeon Yong Woo; J Korean Inst Electr Electron Mater Eng 2003;16(2):157-162. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.157

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Construction and Evaluation of Oxidation System for Superconductor Thin Film: Jung Kwan Lim, Yong Pil Park, Gyung Yong Song; J Korean Inst Electr Electron Mater Eng 2003;16(2):163-167. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.163

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High Voltage Engineering : Analysis of Electron Transport Coefficients in Low Voltage Air Circuit Breaker Using MCS end BE: Sung Chul Ha, Sang Hyun Seo; J Korean Inst Electr Electron Mater Eng 2003;16(2):168-172. Published online February 1, 2003; DOI: https://doi.org/10.4313/JKEM.2003.16.2.168

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