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Volume 22(2); February 2009

Electrical and Material Characteristics of HfO2 Film in HfO2/Hf/Si MOS Structure
Kun Ho Bae, Seung Woo Do, Jae Sung Lee, Yong Hyun Lee
J Korean Inst Electr Electron Mater Eng 2009;22(2):101-106.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.101
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Improved Air Stability of OTFT`s with a P3HT/POSS Active Layer
Jeong Hwan Park, Kyo Yong Han
J Korean Inst Electr Electron Mater Eng 2009;22(2):107-113.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.107

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  • Characteristics of Organic Thin Film Transistors with Organic and Organic-inorganic Hybrid Polymer Gate Dielectric
    In Seob Bae, Ha Young Lim, Su Heon Cho, Song Hee Moon, Won Seok Choi
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2009; 22(12): 1009.     CrossRef
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Effect of PVA Brush Contamination on Post-CMP Cleaning Performance
Han Chul Cho, Min Jong Yuh, Suk Joo Kim, Hae Do Jeong
J Korean Inst Electr Electron Mater Eng 2009;22(2):114-118.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.114

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  • Combined Effects of PVA Brush Scrubbing Parameters and Processes on Post-CMP Cross-Contamination
    Kwang-Min Han, Sumit Kumar, Mir Jalal Khan, Jae-Hyeong Lee, Tae-Gon Kim, Jin-Goo Park
    ECS Journal of Solid State Science and Technology.2025; 14(4): 044013.     CrossRef
  • Particle removal behavior of micropatterned pad buffing in post-CMP cleaning
    Hokyoung Jung, Youngwook Park, Hanchul Cho, Doyeon Kim, Taekyung Lee, Haedo Jeong, Hyoungjae Kim
    Materials Science in Semiconductor Processing.2025; 194: 109530.     CrossRef
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A Study on the Design of a ROIC for Uncooled Bolometer Thermal Image Sensor using Reference Resistor Compensation
Seung Woo Yu, Sang Hyeon Kwak, Eun Sik Jung, Man Young Sung
J Korean Inst Electr Electron Mater Eng 2009;22(2):119-122.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.119
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Study on the Electric Characteristics of Electroplated Micro Vias with Current Mode
Doo Yeol Cha, Min Suck Kang, Se Jun Cho, Sung Pil Jang
J Korean Inst Electr Electron Mater Eng 2009;22(2):123-127.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.123
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Simulation Study on Lon-implanted 4H-SiC p-n Diodes
Jae Sang Lee, Wook Bahng, Sang Cheol Kim, Nam Kyun Kim, Sang Mo Koo
J Korean Inst Electr Electron Mater Eng 2009;22(2):128-131.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.128
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Properties of SiOCH Thin Film Low Dielectric by BTMSM/O2 Flow Rates
In Cheol Park, Hong Bae Kim
J Korean Inst Electr Electron Mater Eng 2009;22(2):132-136.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.132
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Characterization of AI-doped ZnO (AZO) Transparent Conductive Thin Films Grown by Atomic Layer Deposition
Hyun June Jung, Woong Chul Shin, Soon Gil Yoon
J Korean Inst Electr Electron Mater Eng 2009;22(2):137-141.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.137

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  • Review Article: Atomic layer deposition of doped ZnO films
    Zhengning Gao, Parag Banerjee
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films.2019;[Epub]     CrossRef
  • Experimental Study on Fabrication of AZO Transparent Electrode for Organic Solar Cell Using Selective Low-Temperature Atomic Layer Deposition
    Ki-Cheol Kim, Gen-Soo Song, Hyung-Tae Kim, Kyung-Hoon Yoo, Jeong-Jin Kang, Jun-Young Hwang, Sang-Ho Lee, Kyung-Tae Kang, Heui-Seok Kang, Young-June Cho
    Transactions of the Korean Society of Mechanical Engineers B.2013; 37(6): 577.     CrossRef
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Frequency Characteristics Variation of a Class I Flextensional Transducer
Kook Jin Kang, Jong Hoo Paik, Young Jin Lee
J Korean Inst Electr Electron Mater Eng 2009;22(2):142-150.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.142
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Temperature-dependent Resistance Change of Conductive CNT Thin-film
Min Kyu Kwon, Yong Taek Hong
J Korean Inst Electr Electron Mater Eng 2009;22(2):151-157.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.151

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  • The Fabrication of Gas Sensors using MWCNTs
    Kyung Uk Jang, Myung Ho Kim
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2009; 22(12): 1089.     CrossRef
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Preparation and Luminescent Properties of Zn2SiO4: Mn, Ga Phosphors
Ji Young Lee, Yun Sik Yu, Il Yu
J Korean Inst Electr Electron Mater Eng 2009;22(2):158-162.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.158
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Organic Electroluminescence using Hyperbranched Poly(Phenylene Vinylene)
In Sik In
J Korean Inst Electr Electron Mater Eng 2009;22(2):163-168.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.163
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Response Characteristics of Charged Particle Type Display
Dong Jin Lee, Young Cho Kim
J Korean Inst Electr Electron Mater Eng 2009;22(2):169-173.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.169

Citations

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  • Reflectivity Improvement by Particle Neutralization in a Charged Particle-Type Electronic Display
    Young-Cho Kim
    Transactions on Electrical and Electronic Materials.2013; 14(1): 36.     CrossRef
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A Study on the Phase Noise Improvement of Oscillator using Dielectric-rod Loaded Cavity Resonators with HTS End-plates
Won Hui Lee
J Korean Inst Electr Electron Mater Eng 2009;22(2):174-177.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.174
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A Study on Electrical Accident of Distributing Cable Termination Considering PL Law Environment
Sang Hyun Kim, Jae Hyeong Choi, Jin Wook Choi, Seung Myeong Baek
J Korean Inst Electr Electron Mater Eng 2009;22(2):178-183.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.178
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Comparison of Arc Control Ability as a Function of Configuration of Spiral Type VI Contacts by Measuring Arcing Time
Byoung Chul Kim, Hong Tae Park, Ill Sung Oh, Kee Joe Lim
J Korean Inst Electr Electron Mater Eng 2009;22(2):184-190.   Published online February 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.2.184
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