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a-Si (1)
Ag doping (1)
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Attrition milling (1)
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Yong Han Roh (2)
Jun Sin Yi (2)
Ju Hyun Yoo (2)
Hyung Keun Ahn (1)
Kyoung Sung Bae (1)
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Yong Han Roh (2)
Jun Sin Yi (2)
Ju Hyun Yoo (2)
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Kyoung Sung Bae (1)
Jeong Ho Cho (1)
Jong Rae Cho (1)
Jae Young Choi (1)
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Yeol Choi (1)
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Previous issues
Volume 21(3); March 2008
Analytical Model of TFT Drain Current based on Effective Area and Average Velocity
Tae Hee Jung, Chang Sub Won, Se Hwan Ryu, Deuk Young Han, Hyung Keun Ahn
J Korean Inst Electr Electron Mater Eng
2008;21(3):197-202.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.197
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Development of Microstructure Pad and Its Performances in STI CMP
Suk Hoon Jeong, Jae Woo Jung, Ki Hyun Park, Heon Deok Seo, Jae Hong Park, Boum Young Park, Suk Bae Joo, Jae Young Choi, Hae Do Jeong
J Korean Inst Electr Electron Mater Eng
2008;21(3):203-207.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.203
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31
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0
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Study on P-type in-situ doped Polysilicon Films
Jung Sup Oh, Sang Eun Lee, Jin Tae Noh, Sang Woo Lee, Kyoung Sung Bae, Yong Han Roh
J Korean Inst Electr Electron Mater Eng
2008;21(3):208-212.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.208
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30
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The Improvement of Matching of Amplifier Input Transistor for Display Driver IC
Hyeon Cheol Kim, Yong Han Roh
J Korean Inst Electr Electron Mater Eng
2008;21(3):213-216.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.213
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32
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Electrical Properties of Donor-doped BaTiO3 Ceramics by Attrition Milling and Calcination Temperature
Jeong Cheol Lee, Seong Jae Myong, Myoung Pyo Chun, Jeong Ho Cho, Byung Ik Kim, Dong Wook Shin
J Korean Inst Electr Electron Mater Eng
2008;21(3):217-221.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.217
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35
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The Micro Bubble Effect in the Seed Adhesion on the Crystal Quality of 6H- SiC grown by a Physical Vapor Transport (PVT) Process
Jung Gon Kim, Jung Gyu Kim, Chang Hyun Son, Jung Woo Choi, Hyun Hee Hwang, Won Jae Lee, Il Soo Kim, Byoung Chul Shin
J Korean Inst Electr Electron Mater Eng
2008;21(3):222-226.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.222
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32
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Piezoelectric and Dielectric Properties of Low Temperature Sintering Pb(Zn1/2W1/2)O3-Pb(Mn1/3Nb2/3)O3-Pb(Zr0.48Ti0.52)O3 Ceramics Manufactured by Post-annealing Method
Ju Hyun Yoo, Kab Soo Lee
J Korean Inst Electr Electron Mater Eng
2008;21(3):227-231.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.227
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27
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A Study on the Properties of the Low Temperature Sintered Piezoelectrics for Actuator Application
Sung Lim Ryu, Sang Ho Lee, Ju Hyun Yoo
J Korean Inst Electr Electron Mater Eng
2008;21(3):232-235.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.232
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Effect of Solvent Mixture Ratio on Rheology Property of Slurry and Thickness Control of Ceramic Green Sheets
Jun Young Kim, Seung Taek Kim, Jong Chul Park, Myong Jae Yoo
J Korean Inst Electr Electron Mater Eng
2008;21(3):236-241.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.236
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36
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Effects of Different Dopants(B, Al, Ga, In) on the Properties of Transparent conducting ZnO Thin Films
Young Woo No, Jong Rae Cho, Se Mo Son, Su Tae Chung
J Korean Inst Electr Electron Mater Eng
2008;21(3):242-248.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.242
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26
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Ag Doping Effect on Li[Ni0.2Li0.2Mn0.6]O2 Cathode Material
Jea Hyeok Ryu, Seuk Buom Kim, Yong Joon Park
J Korean Inst Electr Electron Mater Eng
2008;21(3):249-254.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.249
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36
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Built-in Voltage in Organic Light-emitting Diodes depending on the Alq3 Layer Thickness
Eun Hye Lee, Hee Myoung Yoon, Tae Wan Kim
J Korean Inst Electr Electron Mater Eng
2008;21(3):255-259.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.255
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29
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A Study on the Lateral Field Effect of VA-LCDs
Cheol Jae Lim
J Korean Inst Electr Electron Mater Eng
2008;21(3):260-264.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.260
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28
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Improvement of COF Bending-induced Lead Broken Failure in LCD Module
Boum Joo Shim, Yeol Choi, Jun Sin Yi
J Korean Inst Electr Electron Mater Eng
2008;21(3):265-271.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.265
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36
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A Study on Application of Stepwise Gate Signal for a-Si Gate Driver
Jae Hoon Myung, Jin Oh Kwag, Jun Sin Yi
J Korean Inst Electr Electron Mater Eng
2008;21(3):272-278.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.272
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36
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A Study on the Effects of CNC Addition on Electrochemical Properties of Lead-acid Battery
Jee Hoon Kim, Jun Ho Mun, Seong Yong Moon, Bon Keun Ku, Ki Won Kim
J Korean Inst Electr Electron Mater Eng
2008;21(3):279-285.
Published online March 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.3.279
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32
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