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Volume 19(8); August 2006

Structural Variation of Diamond-Like Carbon Thin Film According to the Annealing Temperature
J Korean Inst Electr Electron Mater Eng 2006;19(8):701-706.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.701
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Piezoelectric Properties in ZnO Dopped (Na,K)NbO3 Ceramics
J Korean Inst Electr Electron Mater Eng 2006;19(8):707-711.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.707
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Thickness Dependence of the Electrical Properties in NiCr Thin Film Resistors Annealed in a Vacuum Ambient for π- type Attenuator Applications
Won Jae Lee, Soon Gil Yoon, Nguyen Mai Phuong
J Korean Inst Electr Electron Mater Eng 2006;19(8):712-716.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.712
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Piezoelectric Properties of Lead Free (Na,K,Cd)NbO3 Ceramics
J Korean Inst Electr Electron Mater Eng 2006;19(8):717-723.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.717
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A Study on the Oxidation-reduction Reaction of Organic Thin Films
J Korean Inst Electr Electron Mater Eng 2006;19(8):724-731.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.724
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Physical Characteristics of Polycrystalline 3C-SiC Thin Films Grown by LPCVD
J Korean Inst Electr Electron Mater Eng 2006;19(8):732-736.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.732
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High Rate Performance of Li[Co(0.50)Li(0.17)Mn(0.33)]O2 Cathode
J Korean Inst Electr Electron Mater Eng 2006;19(8):737-743.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.737
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Luminescence of InBO3:Tb Phosphor
J Korean Inst Electr Electron Mater Eng 2006;19(8):744-748.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.744
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Luminescence Characteristics of ZnGa2O4 Phosphor Thick Films Prepared by Screen Printing Method
J Korean Inst Electr Electron Mater Eng 2006;19(8):749-753.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.749
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Passivation Properties of SiNx Thin Film for OLED Device
J Korean Inst Electr Electron Mater Eng 2006;19(8):758-763.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.758
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Analysis of the Structural Properties for ZnO/Sapphire(0001) Thin Films by In-situ Atmosphere Annealing
J Korean Inst Electr Electron Mater Eng 2006;19(8):769-774.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.769
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Light Enhancement Al2O3 Passivation in InGaN/GaN based Blue Light-emitting Diode Lamps
Soon Jin So, Kyeong Min Kim, Choon Bae Park
J Korean Inst Electr Electron Mater Eng 2006;19(8):775-779.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.775
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Fabrication of Micromachined On-chip High Ratio Air Core Solenoid Inductor
Jeong Bong Lee
J Korean Inst Electr Electron Mater Eng 2006;19(8):780-784.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.780
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Fabrication of High Tc Superconductor using Thermal Pyrolysis Method
J Korean Inst Electr Electron Mater Eng 2006;19(8):785-789.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.785
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