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Nano CMOSFET
WHERE t1.sid in(parameter_dbtbl_keyword '%Nano CMOSFET%') and t1.xml_status <> 99
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"Nano CMOSFET"
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Nano CMOSFET (3)
Boron penetration (2)
Fixed oxide charge (Qf) (1)
Flicker noise (1/f noise) (1)
Initial-oxidation (1)
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2007 (2)
2005 (1)
Keywords
Nano CMOSFET (3)
Boron penetration (2)
Fixed oxide charge (Qf) (1)
Flicker noise (1/f noise) (1)
Initial-oxidation (1)
Interface trap charge (Qit) (1)
Low-frequency noise (1)
NBTI (1)
Negative bias temperature instability (1)
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Retardation of dopant diffusion (1)
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"Nano CMOSFET"
Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET
J Electr Electron Mater
2007;20(7):569-574.
Published online July 1, 2007
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Dependence of Low-frequency Noise and Device Characteristics on Initial Oxidation Method of Plasma-nitride Oxide for Nano-scale CMOSFET
J Electr Electron Mater
2007;20(1):1-7.
Published online January 1, 2007
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A Stacked Polusilicon Strucutre by Nitridation in N2 Atmosphere for Nano-scale CMOSFETs
J Electr Electron Mater
2005;18(11):1001-1006.
Published online November 1, 2005
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