Electro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes

Jun Ho Jung; Kyung Su Ha; Young Jin Lim; Il Sou Yoo; Yeon Hak Jeong; Jae Jin Lyu; Kyeong Hyeon Kim; Seung Hee Lee

Articles

Page Path

FFS 모드의 공통전극과 화소전극 사이의 절연층 두께에 따른 전기광학 특성

정준호, 하경수, 임영진, 유일수, 정연학, 유재진, 김경현, 이승희

Electro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes

Jun Ho Jung, Kyung Su Ha, Young Jin Lim, Il Sou Yoo, Yeon Hak Jeong, Jae Jin Lyu, Kyeong Hyeon Kim, Seung Hee Lee

J Electr Electron Mater 2009;22(7):589-594.
Published online: July 1, 2009

9 Views
0 Download
0 Crossref
0 Scopus

prev next

Full Article

Download PDF

Keywords: Fringe-field switching, FFS, Passivation thickness, Liquid crystal display

Cite

CITE

export

Copy Download

Format

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

RIS — For EndNote, ProCite, RefWorks, and most other reference management software
BibTeX — For JabRef, BibDesk, and other BibTeX-specific software

Include:

Citation for the content below
Citation and abstract for the content below

Electro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes

J Electr Electron Mater. 2009;22(7):589-594. Published online July 1, 2009

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

RIS — For EndNote, ProCite, RefWorks, and most other reference management software
bib — For JabRef, BibDesk, and other BibTeX-specific software

Include:

Citation for the content below
Citation and abstract for the content below

Electro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes

J Electr Electron Mater. 2009;22(7):589-594. Published online July 1, 2009

Articles

Page Path

FFS 모드의 공통전극과 화소전극 사이의 절연층 두께에 따른 전기광학 특성

Electro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes

Full Article

CITE

Download Citation

Format:

Include:

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS