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Jin Young Kang (2)
Hong Seung Kim (2)
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Jin Young Kang (2)
Hong Seung Kim (2)
Seung Yun Lee (2)
Jeong Yong Lee (2)
Dae Shik Seo (2)
Kyu Hwan Shim (2)
H . W Back (1)
S . M. Baek (1)
M . G Byun (1)
Kyoung Ik Cho (1)
Sang Hee Cho (1)
Hoon Young Choi (1)
Kyo Hyuck Choo (1)
Su Tae Chung (1)
J . M. Chung (1)
S . Y. Chung (1)
Gye Won Hong (1)
Jeoung Yeon Hwang (1)
Eui Goo Jang (1)
Gun Eik Jang (1)
Seung Youl Kang (1)
Ey Goo Kang (1)
Y . H Kim (1)
Jong Min Kim (1)
Sang Yong Kim (1)
Jae Youn Kim (1)
Boo Keun Kim (1)
Kang Eun Kim (1)
Ki Baik Kim (1)
Kee Man Kim (1)
Y . S. Kim (1)
S . H. Kim (1)
Kae Dal Kwack (1)
Kwang Ho Kwon (1)
J . H Lee (1)
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Hyung Jong Lee (1)
Woo Sun Lee (1)
Shung Hee Lee (1)
Seok Hyun Lee (1)
Ho Jin Lee (1)
B . S. Lee (1)
D . G Lim (1)
Sang Jun Park (1)
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Previous issues
Volume 13(2); February 2000
Manipulation of Microstructure of In-situ Phosphotus - Doped Poly Silicon Films Deposited on Silicon Substrate Using Two Step Growth of Reduced Pressure Chemical Vapor Deposition
Hong Seung Kim, Kyu Hwan Shim, Seung Yun Lee, Jeong Yong Lee, Jin Young Kang
J Electr Electron Mater
2000;13(2):95-100.
Published online February 1, 2000
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The Analysis of Characteristics on n-channel Offset - gated Poly-Si TFT's with Electrical Stress
M . G Byun, J . H Lee, D . G Lim, H . W Back, Y . H Kim
J Electr Electron Mater
2000;13(2):101-105.
Published online February 1, 2000
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A Study on the TCAD Simulation to Predict the Latchup Immunity of High Energy Ion Implanted CMOS Twin Well Structures
Han Jung Song, Jong Min Kim, Kae Dal Kwack
J Electr Electron Mater
2000;13(2):106-113.
Published online February 1, 2000
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A Study on the Silicon Etching Characteristics in ECR using SF6 / Cl2 Gas Mixtures
Sang Kyun Lee, Seung Youl Kang, Kwang Ho Kwon, Jin Ho Lee, Kyoung Ik Cho, Hyung Jong Lee
J Electr Electron Mater
2000;13(2):114-119.
Published online February 1, 2000
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Study on Improved Switching Characteristics of LIGBT by the Trap Injection
Kyo Hyuck Choo, Ey Goo Kang, Man Young Sung
J Electr Electron Mater
2000;13(2):120-124.
Published online February 1, 2000
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High - Quality Epitaxial Low Temperature Growth of In Situ Phosphorus - Doped Si Films by Promoting Dispersion of Native Oxides
Hong Seung Kim, Kyu Hwan Shim, Seung Yun Lee, Jeong Yong Lee, Jin Young Kang
J Electr Electron Mater
2000;13(2):125-130.
Published online February 1, 2000
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CMP Slurry Induction Properties of Silicate Oxides Deposited on Silicon Wafer
Sang Yong Kim, Yong Jin Seo, Woo Sun Lee, Eui Goo Jang
J Electr Electron Mater
2000;13(2):131-136.
Published online February 1, 2000
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Sintering and Dielectric Properties of YMnO3 Ceramics with the Effect of Y/Mn Ratio
Jae Youn Kim, Boo Keun Kim, Kang Eun Kim, Su Tae Chung, Sang Hee Cho
J Electr Electron Mater
2000;13(2):137-142.
Published online February 1, 2000
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Capacitor characteristics of SBT Ferroelectric Thin Films depending on substrate conditions
Sang Jun Park, Gun Eik Jang
J Electr Electron Mater
2000;13(2):143-150.
Published online February 1, 2000
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Effects of alignment layer on pretilt generation and electrical characteristics for nematic liquid crystal by using photo - alignment techniques
Dae Shik Seo, Tae Gyu Park, Shung Hee Lee
J Electr Electron Mater
2000;13(2):151-156.
Published online February 1, 2000
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Electro - optical characteristics of photo - aligned TN-LCD using a new photo dimerization method
Jeoung Yeon Hwang, Dae Shik Seo
J Electr Electron Mater
2000;13(2):157-162.
Published online February 1, 2000
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The characteristics of anti-erosion for MgO Protecting layer in Plasma display panel
Hoon Young Choi, Seok Hyun Lee
J Electr Electron Mater
2000;13(2):163-169.
Published online February 1, 2000
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DC Performance of Nb3Sn Cable Joints with multi-interfaces
Ho Jin Lee, Ki Baik Kim, Je Uk Yeon, Gye Won Hong, Kee Man Kim
J Electr Electron Mater
2000;13(2):170-176.
Published online February 1, 2000
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Characteristics of Surface Flashover on Partially Immersed of Spacer in Liquid Nitrogen
Y . S. Kim, B . S. Lee, S . M. Baek, J . M. Chung, S . Y. Chung, S . H. Kim
J Electr Electron Mater
2000;13(2):177-182.
Published online February 1, 2000
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