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(P:P)polarized (1)
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Previous issues
Volume 20(3); March 2007
The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices
J Korean Inst Electr Electron Mater Eng
2007;20(3):197-201.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.197
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Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering
Hu Jie Jin, Soon Jin So, Choon Bae Park
J Korean Inst Electr Electron Mater Eng
2007;20(3):202-206.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.202
PDF
Citations
Citations to this article as recorded by
Photoluminescence Characteristics of ZnO Nano Needle-like Rods grown by the Hot Wall Epitaxy Method
Sung-Hwan Eom, Yong-Dae Choi
Transactions on Electrical and Electronic Materials.2007; 8(5): 191.
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Annealing Effects on Concentration Profiles of Deep Energy Levels in Platinum-diffused Silicon
J Korean Inst Electr Electron Mater Eng
2007;20(3):207-212.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.207
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36
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Planarizaiton of Cu Interconnect using ECMP Process
J Korean Inst Electr Electron Mater Eng
2007;20(3):213-217.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.213
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35
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Sensitivity Characteristics of Acoustic Emission(AE) Sensor using the Lead-free (Na,K)NbO3 Ceramics
J Korean Inst Electr Electron Mater Eng
2007;20(3):218-222.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.218
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35
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Ferroelectric Properties of Bi(3.25)La(0.75)Ti3O(12) Thin Films with Eu Contents for Non-volatile Memory Device Application
J Korean Inst Electr Electron Mater Eng
2007;20(3):223-227.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.223
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36
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Development of Core Technologies for Integrating Combustible Hydrogen Gas Sensor
J Korean Inst Electr Electron Mater Eng
2007;20(3):228-233.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.228
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31
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Effect of Surface Treatments of Polycrystalline 3C-SiC Thin Films on Ohmic Contact for Extreme Environment MEMS Applications
J Korean Inst Electr Electron Mater Eng
2007;20(3):234-239.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.234
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30
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Holographic Data Grating Formation of As(40)Ge(10)Se(15)S(35) Single Layer, Ag/As(40)Ge(10)Se(15)S(35) Double Layer and As(40)Ge(10)Se(15)S(35)/Ag/As(40)Ge(10)Se(15)S(35) Multi-Layer Thin Films with the DPSS Laser
J Korean Inst Electr Electron Mater Eng
2007;20(3):240-244.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.240
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31
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Liquid Crystal Aligning Capabilities Treated on Organic Overcoat Thin Films by Ion Beam Irradiation Method
Jeong Min Han, Byoung Yong Kim, Jong Yeon Kim, Young Hwan Kim, Jin Woo Han, Jeoung Yeon Hwang, Sang Keuk Lee, Dong Hun Kang, Chul Ho Ok, Dae Shik Seo
J Korean Inst Electr Electron Mater Eng
2007;20(3):245-249.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.245
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Analysis on the Gray Scale Capability of TFT-LCD using Three-dimensional Simulation
J Korean Inst Electr Electron Mater Eng
2007;20(3):250-256.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.250
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39
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Improved Efficiency and Lifetime for Organic Light-emitting Devices based on Mixed-hole Transporting Layer
J Korean Inst Electr Electron Mater Eng
2007;20(3):257-262.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.257
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31
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Properly Changes of Europium-Silicate Thin Films depending on the Ambient Gas
J Korean Inst Electr Electron Mater Eng
2007;20(3):263-267.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.263
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34
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InGaAs/InP HPT`s with ITO Transparent Emitter Contacts
J Korean Inst Electr Electron Mater Eng
2007;20(3):268-272.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.268
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Temperature and Leakage Current Characteristics of Polymeric Surge Arrester with Housing
J Korean Inst Electr Electron Mater Eng
2007;20(3):273-280.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.273
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42
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Characteristic Measurement by a Real-time Data Acquisition System in Overhead Contact Wire
J Korean Inst Electr Electron Mater Eng
2007;20(3):281-285.
Published online March 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.3.281
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30
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