Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
BROWSE ARTICLES
Previous issues
16
results for
Previous issues
Filter
Keywords
chemical mechanical polishing (4)
CMP (3)
AC Loss (1)
Attachment (1)
Bifilar coil (1)
More +
Authors
Jun Hoi Lee (1)
Sung Jik Lee (1)
Min Soo Lee (1)
Jae Soo Shin (1)
Keywords
chemical mechanical polishing (4)
CMP (3)
AC Loss (1)
Attachment (1)
Bifilar coil (1)
Boltzmann equation (1)
Buffer (1)
C3F8 (1)
Carbon nanotube (1)
CMOS (1)
Conditioning temperature (1)
Conventional coil (1)
Copper(2) phthalocyanine thin film (1)
Crystal orientation (1)
Dishing (1)
Dye-sensitized solar cell (1)
E/N (1)
Effective ionization (1)
Electrical conductivity (1)
Electrochemical corrosion (1)
Eros on (1)
Fault current Limiting characteristics (1)
Fault current Limiting element of a coil type (1)
Ferroelectric (1)
Fixed abrasive pad (1)
Flux-Lock type superconducting fault current Limiter (1)
Friction force (1)
Friction force monitoring (1)
Helical coil (1)
HMOS (1)
Hollow cathode (1)
Hydrogen annealing (1)
Initial Limiting current Level (1)
Interface between metal and organic material (1)
Interfacial electronic structrure (1)
Ionization (1)
La0.8Sr0.2Ga0.8Mg0.2O(3-δ) Solid electrolyte (1)
LaGaO3 (1)
LaNiO3 (1)
MgO (1)
Mixed oxidizer (1)
Near-field scanning microwave microscope (1)
NSMM (1)
Optogalvanic effect (1)
Orientation (1)
Overpolishing (1)
Oxide film (1)
Pad conditioning (1)
Pattern selectivity (1)
PDP (1)
PFC (1)
Plasma temperature (1)
Potentiodynamic polarization (1)
PZT (1)
PZT thin film (1)
Quench characteristics (1)
RE-CMOS (1)
Reduced pressure chemical vapor deposition (1)
Reflection coefficient S11 (1)
RFID tag (1)
SiGe (1)
Sol-gel (1)
Space charge (1)
Stick-slip (1)
Surface potential (1)
Tandem solar cell (1)
The independent operation of HTSC element (1)
Thermoelectric generator (1)
Ubiquitous (1)
Vacuum in-Line sealing (1)
Viscoelastic behavior (1)
δ-Doping (1)
Cancel
Close
authors
Jun Hoi Lee (1)
Sung Jik Lee (1)
Min Soo Lee (1)
Jae Soo Shin (1)
Cancel
Close
Funded articles
Cancel
Close
Previous issues
Volume 18(4); April 2005
Development of SiGe Heterostructure Epitaxial Growth and Device Fabrication Technology using Reduced Pressure Chemical Vapor Deposition
J Electr Electron Mater
2005;18(4):285-296.
Published online April 1, 2005
PDF
4
View
0
Download
CMP Properties of Oxide Film with Various Pad Conditioning Temperatures
J Electr Electron Mater
2005;18(4):297-302.
Published online April 1, 2005
PDF
6
View
0
Download
Electrochemical Corrosion and Chemical Mechanical Polishing(CMP) Characteristics of Tungsten Film using Mixed Oxidizer
J Electr Electron Mater
2005;18(4):303-308.
Published online April 1, 2005
PDF
6
View
0
Download
Design of 13.56 MHz RFID Tag IC
J Electr Electron Mater
2005;18(4):309-312.
Published online April 1, 2005
PDF
6
View
0
Download
A Study on the Characteristics of Stick-slip Friction in CMP
J Electr Electron Mater
2005;18(4):313-320.
Published online April 1, 2005
PDF
7
View
0
Download
Fixed Abrasive Pad with Self-conditioning in CMP Process
J Electr Electron Mater
2005;18(4):321-326.
Published online April 1, 2005
PDF
5
View
0
Download
Effect of the Hydrogen Annealing on the Pb(Zr0.52Ti0.48)O3 Film using (Pb0.72La0.28)Ti0.94O3 Buffers
J Electr Electron Mater
2005;18(4):327-329.
Published online April 1, 2005
PDF
6
View
0
Download
Effects of the Transition Metal Oxides Substituted for Mg on the Electrical Conductivity of La0.8Sr0.2Ga0.8Mg0.2O(3-δ)-based Electrolytes
J Electr Electron Mater
2005;18(4):330-337.
Published online April 1, 2005
PDF
6
View
0
Download
Effects of (100) Orientation of LaNiO3 on the Growth and Ferroelectric Properties of Pb(Zr, Ti)O3 Thin Films
J Electr Electron Mater
2005;18(4):338-343.
Published online April 1, 2005
PDF
6
View
0
Download
Electrical and Optical Characteristics of Plasma Display Panel Fabricated by Vacuum In-Line Sealing
J Electr Electron Mater
2005;18(4):344-349.
Published online April 1, 2005
PDF
5
View
0
Download
Study of Space Charge of Metal/copper(2)-phthalocyanine Interface
J Electr Electron Mater
2005;18(4):350-356.
Published online April 1, 2005
PDF
5
View
0
Download
Structure and Characteristics of Tandem Solar Cell Composed of Dye-sensitized Solar Cell and Thermoelectric Generator
J Electr Electron Mater
2005;18(4):357-362.
Published online April 1, 2005
PDF
5
View
0
Download
Comparison of Operating Characteristics between Flux-Lock Type and Resistive Type Superconducting Fault Current Limiters
J Electr Electron Mater
2005;18(4):363-369.
Published online April 1, 2005
PDF
4
View
0
Download
AC Loss Characteristic in the Fault Current Limiting Elements of a Coil Type
J Electr Electron Mater
2005;18(4):370-374.
Published online April 1, 2005
PDF
8
View
0
Download
The Character of Electron Ionization and Attachment Coefficients in Perfluoropropane(C3F8) Molecular Gas by the Boltzmann Equation
J Electr Electron Mater
2005;18(4):375-380.
Published online April 1, 2005
PDF
8
View
1
Download
Measurement of Ar Temperature of Hollow Cathode Discharge Plasma
Jun Hoi Lee, Jae Soo Shin, Sung Jik Lee, Min Soo Lee
J Electr Electron Mater
2005;18(4):381-385.
Published online April 1, 2005
PDF
7
View
1
Download
First
Prev
Page
of 1
Next
Last
×
TOP