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Volume 19(4); April 2006

Effect of Pad Surface Characteristics on Within Wafer Non-uniformity in CMP: J Korean Inst Electr Electron Mater Eng 2006;19(4):309-313. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.309

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Electrical Characteristics of SRAM Cell With stacked single Crystal Silicon TFT Cell: J Korean Inst Electr Electron Mater Eng 2006;19(4):314-321. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.314

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Influence of Sputter Power on the Structural and Optical Properties of CdS Films for Photovoltaic Applications: J Korean Inst Electr Electron Mater Eng 2006;19(4):322-327. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.322

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Electrical and Optical Properties of CdS Thin Film with Different Substrate Temperatures
Jung Cheul Park, Woo Sik Lee, Soon Nam Chu, Yong Joon Cho, Yong Woo Jeon
Journal of Korean Institute of Electrical and Electronic Materials Engineers.2009; 22(9): 792. CrossRef

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Development of a Pressure Measurement System with the Parallel Structure: J Korean Inst Electr Electron Mater Eng 2006;19(4):328-333. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.328

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Passivation of Silicon Oxide Film Deposited at Low Temperature by Annealing in Nitrogen Ambient: J Korean Inst Electr Electron Mater Eng 2006;19(4):334-338. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.334

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Signal Transmission Properties of the Inductive Coupler using the High Permeability Magnetic Materials: Hyun Sik Kim, Jong Ryung Kim, Hae Yeon Lee, Ki Uk Kim, Jeong Seob Huh, Jun Hui Lee, Young Woo Oh, Woo Bong Byon, Kwi Yil Gwak, Seong Ho Ju; J Korean Inst Electr Electron Mater Eng 2006;19(4):339-343. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.339

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4H-SiC (0001）Epilayer Growth and Electrical Property of Schottky Diode: Shigehiro Nishino; J Korean Inst Electr Electron Mater Eng 2006;19(4):344-349. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.344

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Electrical characteristics of polycrystalline 3C-SiC thin film diodes
Gwiy-Sang Chung, Jeong-Hak Ahn
Journal of Sensor Science and Technology.2007; 16(4): 259. CrossRef

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Electrical Characteristics of Piezoelectric Transformer using Low Temperature Sintering PCW-PMN-PZT Ceramics: J Korean Inst Electr Electron Mater Eng 2006;19(4):350-356. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.350

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Effect of Adhesion Layer on Gate Insulator: J Korean Inst Electr Electron Mater Eng 2006;19(4):357-361. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.357

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Electrical Characteristics on the Variation of Thickness and Deposition Rate in Organic Layer of OLEDs: J Korean Inst Electr Electron Mater Eng 2006;19(4):362-366. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.362

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Fabrication of CNT FEA Self-aligned between Gate and Emitter using Screen Printing Method: J Korean Inst Electr Electron Mater Eng 2006;19(4):367-372. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.367

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A Study on the Surface Treatment of CNT Paste Emitter by Ar Ion Irradiation

Journal of Korean Institute of Electrical and Electronic Materials Engineers.2007; 20(5): 456. CrossRef

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Box Cathode Sputtering Technologies for Organic-based Optoelectronics: Han Ki Kim; J Korean Inst Electr Electron Mater Eng 2006;19(4):373-378. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.373

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Analysis of the Characteristics of a White OLED using the Newly Synthesized Blue Emitting Material nitro-DPVT by Varying the Doping Concentrations of Fluorescent Dye and the Thickness of the NPB Layer: J Korean Inst Electr Electron Mater Eng 2006;19(4):379-385. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.379

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Development of F-theta Lens for Laser Beam Printer: J Korean Inst Electr Electron Mater Eng 2006;19(4):386-390. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.386

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Properties of a Hybrid Type Superconducting Fault Current Limiter using YBa2Cu3O7 Films: J Korean Inst Electr Electron Mater Eng 2006;19(4):391-397. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.391

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Evaluation of Long Duration Current Impulse Withstand Characteristics of ZnO Blocks for High Voltage Surge Arresters: J Korean Inst Electr Electron Mater Eng 2006;19(4):398-403. Published online April 1, 2006; DOI: https://doi.org/10.4313/JKEM.2006.19.4.398

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