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Volume 17(7); July 2004

Effect of Transition Metal Dopant on Electronic State and Chemical Bonding of MnO2: Dong Yoon Lee, Bong Seo Kim, Jae Sung Song, Yang Soo Kim; J Korean Inst Electr Electron Mater Eng 2004;17(7):691-696. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.691

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Modified Illumination by Binary Phase Diffractive Patterns on the Backside of a Photomask: Jai Cheol Lee, Yong Ho Oh, Chun Soo Go; J Korean Inst Electr Electron Mater Eng 2004;17(7):697-700. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.697

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The Development of Deep Silicon Etch Process with Conventional Inductively Coupled Plasma (ICP) Etcher: Soo Beom Jo, Se Geun Park, Beom Hoan O; J Korean Inst Electr Electron Mater Eng 2004;17(7):701-707. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.701

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Shallow p+-n Junction Formation and the Design of Boron Diffusion Simulator: Jae Young Kim, Chung Keun Lee, Bo Ra Kim, Shin Nam Hong; J Korean Inst Electr Electron Mater Eng 2004;17(7):708-712. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.708

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A Study on the Formation of Trench Gate for High Power DMOSFET Applications: Hoon Soo Park, Jin Gun Koo, Young Ki Lee; J Korean Inst Electr Electron Mater Eng 2004;17(7):713-717. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.713

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Crystal Structure of Ba(Mg1/3Nb2/3)O3 - La(Mg2/3Nb1/3)O3 Complex Perovskite Compound: Jong Hoo Paik, Mi Jae Lee, Byung Hyun Choi, Mi Jung Jee, Eun Kyeong Lim, Sahn Nahm; J Korean Inst Electr Electron Mater Eng 2004;17(7):718-723. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.718

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Reactive Ion Etching Characteristics of 3C-SiC Grown on Si Wafers: Gwiy Sang Chung, Soo Yong Chung, Shigehiro Nishino; J Korean Inst Electr Electron Mater Eng 2004;17(7):724-728. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.724

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Electrochemical Detection of Gene using Microelectrode-array DNA Chip: Yong Sung Choi, Young Soo Kwon, Dae Hee Park, Eiichi Tamiya; J Korean Inst Electr Electron Mater Eng 2004;17(7):729-737. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.729

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Substrate Bias Voltage Dependence of Electrical Properties for ZnO:Al Film by DC Magnetron Sputtering: Kang Il Park, Byung Sub Kim, Dong Gun Lim, Su Ho Lee, Dong Joo Kwak; J Korean Inst Electr Electron Mater Eng 2004;17(7):738-746. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.738

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Influence of Heat-treatment on Physical Properties of Nanocrystalline Indium Tin Oxide (ITO) Particle: Sung Jei Hong, Jeong In Han, Sang Gweon Chang; J Korean Inst Electr Electron Mater Eng 2004;17(7):747-753. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.747

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Study on the Fringe Field Switching (FFS) Mode with the Positive Dielectric Anisotropy for the Fast Response Time: M. S. Kim, H. Y. Kim, S. H. Song, S. M. Yang, S. G. Lee, Y. J. Lim, S. H. Lee; J Korean Inst Electr Electron Mater Eng 2004;17(7):754-759. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.754

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Control of High Pretilt Angle in NLC using a NDLC Thin Film: Chang Joon Park, Jeong Yeon Hwang, Dae Shik Seo, Han Jin Ahn, Kyung Chan Kim, Hong Koo Baik; J Korean Inst Electr Electron Mater Eng 2004;17(7):760-763. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.760

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Reduction of Operating Voltage of GaN-based Blue-violet Laser Diode by using Highly Mg Doped GaN Layer: Joon Seop Kwak; J Korean Inst Electr Electron Mater Eng 2004;17(7):764-769. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.764

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Study on Broadband HTS Antenna Array for Satellite Communication: D. C. Chung, C. H. Yun; J Korean Inst Electr Electron Mater Eng 2004;17(7):770-775. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.770

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Study on HTS Antenna Array with Circularly Polarization for DBS Receiver: D. C. Chung, C. H. Yun, H. S. Choi; J Korean Inst Electr Electron Mater Eng 2004;17(7):776-781. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.776

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Analysis of the Critical Characteristics in the Superconducting Strip Lines by ICP Etching System: Seok Cheol Ko, Hyeong Gon Kang, Hyo Sang Choi, Sung Chae Yang, Byoung Sung Han; J Korean Inst Electr Electron Mater Eng 2004;17(7):782-787. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.782

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Electromagnetic Properties of BiPbSrCaCuO Superconductor: Sang Heon Lee; J Korean Inst Electr Electron Mater Eng 2004;17(7):788-792. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.788

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Preparation of Co-Cr-Ta Thin Films using Two step Method For Perpendicular Magnetic recording Layer: Won Hyo Park, Sok Hyun Kong, Woo Seong Che, Hyung Wook Choi, Yong Seo Park, Kyung Hwan Kim; J Korean Inst Electr Electron Mater Eng 2004;17(7):793-796. Published online July 1, 2004; DOI: https://doi.org/10.4313/JKEM.2004.17.7.793

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