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Previous issues
Volume 18(9); September 2005
Binding Energy in the n-type AlχGa(1-χ)As-GaAs Quantum well according to the Trial Function
J Korean Inst Electr Electron Mater Eng
2005;18(9):781-786.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.781
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A Study on Oxidizer Effects in Tungsten CMP
J Korean Inst Electr Electron Mater Eng
2005;18(9):787-792.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.787
PDF
Citations
Citations to this article as recorded by
Effect of Oxidizer on the Polishing in Cadmium Telluride CMP
Byeong Cheol Shin, Chang Suk Lee, Hae Do Jeong
Journal of the Korean Society for Precision Engineering.2015; 32(1): 69.
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Electro-chemical Mechanical Deposition for Planarization of Cu Interconnect
J Korean Inst Electr Electron Mater Eng
2005;18(9):793-797.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.793
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32
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Formation of Fine Pitch Solder Bump with High Uniformity by the Tilted Electrode Ring
J Korean Inst Electr Electron Mater Eng
2005;18(9):798-802.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.798
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38
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Effect of Cerium Ammonium Nitrate and Alumina Abrasive Particles on Polishing Behavior in Ruthenium Chemical Mechanical Planarization
J Korean Inst Electr Electron Mater Eng
2005;18(9):803-809.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.803
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41
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Characterization of Pb(Zr0.2Ti0.8)O3 Thin Films Deposited at Various Temperatures on SrRuO3/SrTiO3 Substrates by Pulsed Laser Deposition
J Korean Inst Electr Electron Mater Eng
2005;18(9):810-814.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.810
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31
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Electrical Properties of ZnO Varistors with Variation of Glass Addition
J Korean Inst Electr Electron Mater Eng
2005;18(9):815-820.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.815
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36
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Piezoelectric and Dielectric Characteristics of Lead-free (Na,K)NbO3 Piezoelectric Ceramic System according to Calcination Temperature
J Korean Inst Electr Electron Mater Eng
2005;18(9):821-826.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.821
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35
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Microwave Properties of Ag Conducting Paste with Various Preparation Conditions
J Korean Inst Electr Electron Mater Eng
2005;18(9):827-832.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.827
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32
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Preparation and Electrochemical Performance of Carbon-PTFE Electrode for Electric Double Layer Capacitor
J Korean Inst Electr Electron Mater Eng
2005;18(9):833-839.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.833
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31
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Three Branches Vertical Hall Sensor for Rotation Angle Detection
J Korean Inst Electr Electron Mater Eng
2005;18(9):840-845.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.840
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32
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Preparation and Luminescent Properties of SrTiO3: Al, Pr Red Phosphors for the FED
J Korean Inst Electr Electron Mater Eng
2005;18(9):846-850.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.846
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35
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Unbalanced Characteristics of the Superconducting Fault Current Limiters with a Single Line-to-ground Fault
J Korean Inst Electr Electron Mater Eng
2005;18(9):851-855.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.851
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32
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Analysis of Fault Current Limiting Characteristics due to Ratio of Inductances between Coil 1 and coil 2 in a Flux-lock Type SFCL
J Korean Inst Electr Electron Mater Eng
2005;18(9):856-862.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.856
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32
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Quench Characteristics of Superconducting Elements using Reactors at Series and Parallel Connections
J Korean Inst Electr Electron Mater Eng
2005;18(9):863-869.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.863
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32
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Observation of Negative Resistance Region in Voltage-current Curve of Hollow Cathode Discharge
J Korean Inst Electr Electron Mater Eng
2005;18(9):870-875.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.870
PDF
35
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